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IEEE Design & Test of Computers
May/June 2005 (vol. 22 no. 3)
ISSN: 0740-7475
Table of Contents
From the EIC
DAC Watch
DAC Highlights (Abstract)
Andrew B. Kahng, University of California, San Diego
Grant Martin, Tensilica
pp. 197-199
The New Face of Design for Manufacturability
Yervant Zorian, Virage Logic
Raul Camposano, Synopsys
Andrzej J. Strojwas, PDF Solutions Inc.
John K. Kibarian, PDF Solutions Inc.
Dennis Wassung, Adams Harkness Inc.
Alex Alexanian, Pont? Solutions Inc.
Steve Wigley, LTX Corp.
Neil Kelly, LTX Corp.
pp. 200-205
Jeng-Liang Tsai, University of Wisconsin-Madison
Dong Hyun Baik, University of Wisconsin-Madison
Charlie Chung-Ping Chen, University of Wisconsin-Madison
Kewal K. Saluja, University of Wisconsin-Madison
pp. 214-222
Special Features
Interview
Book Reviews
Sachin Sapatnekar, University of Minnesota
pp. 280-281
Conference Reports
Standards
DATC Newsletter
The Last Byte
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