Advanced Search 
IEEE Design & Test of Computers
November/December 2004 (vol. 21 no. 6)
ISSN: 0740-7475
Table of Contents
Special Features
EIC Message
Rajesh Gupta, Editor in Chief, IEEE Design & Test
pp. 457
Features
Martin Zambaldi, Infineon Technologies
Wolfgang Ecker, Infineon Technologies
Renate Henftling, Infineon Technologies
Matthias Bauer, Infineon Technologies
pp. 464-471
Young-Il Kim, Korea Advanced Institute of Science and Technology
Chong-Min Kyung, Korea Advanced Institute of Science and Technology Integrated Circuit Design Education Center
pp. 484-493
Fr?d?ric Worm, Swiss Federal Institute of Technology Lausanne
Paolo Ienne, Swiss Federal Institute of Technology Lausanne
Patrick Thiran, Swiss Federal Institute of Technology Lausanne
Giovanni De Micheli, Stanford University
pp. 524-535
Marcel A. Kossel, IBM Zurich Research Laboratory
Martin L. Schmatz, IBM Zurich Research Laboratory
pp. 536-543
Glenn H. Chapman, Simon Fraser University
Sunjaya Djaja, Simon Fraser University
Desmond Y.H. Cheung, Simon Fraser University
Yves Audet, Ecole Polytechnique, Montreal
Israel Koren, University of Massachusetts, Amherst
Zahava Koren, University of Massachusetts, Amherst
pp. 544-551
Fernanda Gusmao de Lima Kastensmidt, State University of Rio Grande do Sul
Gustavo Neuberger, Federal University of Rio Grande do Sul
Renato Fernandes Hentschke, Federal University of Rio Grande do Sul
Luigi Carro, Federal University of Rio Grande do Sul
Ricardo Reis, Federal University of Rio Grande do Sul
pp. 552-562
Ikhwan Lee, Samsung Electronics
Yongseok Choi, Seoul National University
Youngjin Cho, Seoul National University
Yongsoo Joo, Seoul National University
Hyeonmin Lim, Seoul National University
Hyung Gyu Lee, Seoul National University
Hojun Shim, Seoul National University
Naehyuck Chang, Seoul National University
pp. 572-586
Departments
Conference Reports (Abstract)
Vladimir Hahanov, Kharkov National University of Radio Electronics
Raimund Ubar, Tallinn University of Technology
pp. 594-595
The Last Byte
Usage of this product signifies your acceptance of the Terms of Use.