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IEEE Design & Test of Computers
September/October 2004 (vol. 21 no. 5)
ISSN: 0740-7475
Table of Contents
EIC Message
Rajesh Gupta, Editor in Chief, IEEE Design & Test
pp. 345
Conference Reports
Alexander Maxiaguine, Swiss Federal Institute of Technology
Samarjit Chakraborty, National University of Singapore
Simon K?, Swiss Federal Institute of Technology
Lothar Thiele, Swiss Federal Institute of Technology
pp. 368-377
Paul Marchal, IMEC and Katholieke Universiteit Leuven
Francky Catthoor, IMEC and Katholieke Universiteit Leuven
Davide Bruni, University of Bologna
Luca Benini, University of Bologna
Jos? Ignacio G?mez, Universidad Complutense de Madrid
Luis Pi?uel, Universidad Complutense de Madrid
pp. 378-387
Hojun Shim, Seoul National University
Naehyuck Chang, Seoul National University
Massoud Pedram, University of Southern California
pp. 388-396
Sudeep Pasricha, University of California Irvine
Manev Luthra, University of California Irvine
Shivajit Mohapatra, University of California Irvine
Nikil Dutt, University of California Irvine
Nalini Venkatasubramanian, University of California Irvine
pp. 398-405
Haris Lekatsas, NEC Laboratories America
J? Henkel, NEC Laboratories America
Srimat Chakradhar, NEC Laboratories America
Venkata Jakkula, NEC Laboratories America
pp. 406-415
Special Features
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