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2004
Issue No. 4 - July/August
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IEEE Design & Test of Computers
July/August 2004 (vol. 21 no. 4)
ISSN: 0740-7475
Table of Contents
EIC Message
Manufacturing test woes
(HTML)
Rajesh Gupta
, Editor in Chief,
IEEE Design & Test
pp. 269-270
ABSTRACT
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Features
Looking back, looking around
(Abstract)
Sumit DasGupta
, Silicon Integration Initiative
pp. 271-273
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Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates
(HTML)
Andr? Ivanov
, University of British Columbia
Fabrizio Lombardi
, Northeastern University
Cecilia Metra
, University of Bologna
pp. 274-276
ABSTRACT
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Testing Gbps Interfaces without a Gigahertz Tester
(Abstract)
T.M. Mak
, Intel
Mike Tripp
, Intel
Anne Meixner
, Intel
pp. 278-286
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Multiplexing ATE Channels for Production Testing at 2.5 Gbps
(Abstract)
David C. Keezer
, Georgia Institute of Technology
Dany Minier
, IBM Canada
Marie-Christine Caron
, IBM Canada
pp. 288-301
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Jitter Models for the Design and Test of Gbps-Speed Serial Interconnects
(Abstract)
Nelson Ou
, University of British Columbia
Touraj Farahmand
, University of British Columbia
Andy Kuo
, University of British Columbia
Sassan Tabatabaei
, University of British Columbia
Andr? Ivanov
, University of British Columbia
pp. 302-313
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On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz
(Abstract)
Stephen Sunter
, LogicVision
Aubin Roy
, LogicVision
pp. 314-321
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Special Features
A Built-In Parametric Timing Measurement Unit
(Abstract)
Ming-Jun Hsiao
, National Tsing Hua University
Jing-Reng Huang
, National Tsing Hua University
Tsin-Yuan Chang
, National Tsing Hua University
pp. 322-330
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Design & Test Education in Asia
(Abstract)
Debesh K. Das
Hideo Fujiwara
Yungang Li
Yinghua Min
Shiyi Xu
Yervant Zorian
pp. 331-338
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Departments
Conference Reports
(Abstract)
pp. 339-341
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Panel Summaries
(Abstract)
Ajay Khoche
, Agilent Technologies
pp. 342
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Design automation Technical Committee Newsletter
(Abstract)
John Willis
Joe Damore
pp. 343
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Test at Gbps: Megaproblem or micromanagement?
(Abstract)
Rob Aitken
, Artisan Components
pp. 344
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