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IEEE Design & Test of Computers
May/June 2004 (vol. 21 no. 3)
ISSN: 0740-7475
Table of Contents
EIC Message
D&T: 20 Years of Service
Panel Summaries
Mustapha Slamani, IBM Microelectronics
Fidel Muradali, Agilent Technologies
Geir Eide, Teseda
Mike Li, Wavecrest
pp. 175-176, 261-262
Features
Alessandra Nardi, University of California, Berkeley
Alberto L. Sangiovanni-Vincentelli, University of California, Berkeley
pp. 192-199
Davide Appello, STMicroelectronics
Alessandra Fudoli, STMicroelectronics
Katia Giarda, STMicroelectronics
Vincenzo Tancorre, STMicroelectronics
Emil Gizdarski, Synopsys
Ben Mathew, Synopsys
pp. 208-215
Melvin A. Breuer, University of Southern California
Sandeep K. Gupta, University of Southern California
T.M. Mak, Intel
pp. 216-227
Subhasish Mitra, Center for Reliable Computing, Stanford University
Wei-Je Huang, Center for Reliable Computing, Stanford University
Nirmal R. Saxena, Center for Reliable Computing, Stanford University
Shu-Yi Yu, Center for Reliable Computing, Stanford University
Edward J. McCluskey, Center for Reliable Computing, Stanford University
pp. 228-240
T.M. Mak, Intel
Angela Krstic, University of California, Santa Barbara
Kwang-Ting (Tim) Cheng, University of California, Santa Barbara
Li-C. Wang, University of California, Santa Barbara
pp. 241-247
DAC Watch
DAC Highlights (Abstract)
Luciano Lavagno, Cadence Berkeley Labs and Politecnico di Torino
pp. 259-260
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