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IEEE Design & Test of Computers
October-December 2000 (vol. 17 no. 4)
ISSN: 0740-7475
Table of Contents
 | From the EIC |
 | Feature |
 | Special Feature |
 | Standards |
 | Panel Summaries |
 | TTTC Newsletter |
 | DATC Newsletter |
 | Annual Index |
 | The Last Byte |