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IEEE Design & Test of Computers
July-September 2000 (vol. 17 no. 3)
ISSN: 0740-7475
Table of Contents
From the EIC
News
News (Abstract)
pp. 8-10
Feature
Special Feature
Panel Summaries
Panel Summaries (Abstract)
pp. 133-135
Standards
DATC Newsletter
TTTC Newsletter
TTTC Newsletter (Abstract)
pp. 140-141
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