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IEEE Design & Test of Computers
July-September 1999 (vol. 16 no. 3)
ISSN: 0740-7475
Table of Contents
 | From the EIC |
 | Letter to the Editor |
 | News |
 | Article |
 | Feature |
 | Special Feature |
 | Panel Summaries |
 | Conference Reports |
 | Standards |
 | DATC Newsletter |
 | TTTC Newsletter |
 | The Last Byte |