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Design&Test
1998
Issue No. 3 - July-September
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Bibliographic References
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IEEE Design & Test of Computers
July-September 1998 (vol. 15 no. 3)
ISSN: 0740-7475
Table of Contents
Department
Conference Reports
(Abstract)
pp. 2
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From the Editor-in-Chief
Once Again, a Super Issue
(Abstract)
Yervant Zorian
pp. 3
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Keynote
ASIC Challenges: Emerging from a Primordial Soup
(Abstract)
Wilfred Corrigan
pp. 4-7
ABSTRACT
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Feature
Guest Editors' Introduction: Early Modeling and Analysis of Packaged Systems
(HTML)
David E. Schimmel
Chryssa Dislis
pp. 8-9
ABSTRACT
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Analyzing Packaging Trade-Offs During System Design
(Abstract)
Peter A. Sandborn
Mike Vertal
pp. 10-19
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Modeling and Optimizing the Costs of Electronic Systems
(Abstract)
Michael Scheffler
Daniel Ammann
Andreas Thiel
Claus Habiger
Gerhard Tröster
pp. 20-26
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VLSI, MCM, and WSI: A Design Comparison
(Abstract)
Earl E. Swartzlander, Jr.
pp. 28-34
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The Role of the Good-Die Project in Miniaturized-System Design
(Abstract)
Claudio Truzzi
pp. 35-43
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Testing NASA's 3D-Stack MCM Space Flight Computer
(Abstract)
Koppol Sasidhar
Leon Alkalai
Abhijit Chatterjee
pp. 44-55
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Microprocessor Testing
Guest Editor's Introduction: Microprocessor Testing Today
(HTML)
Wayne Needham
pp. 56-57
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Design of Cache Test Hardware on the HP PA8500
(Abstract)
Jeff Brauch
Jay Fleischman
pp. 58-63
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Testability Features of the AMD-K6 Microprocessor
(Abstract)
R. Scott Fetherston
Imtiaz P. Shaik
Siyad C. Ma
pp. 64-69
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Test Development for Second-Generation ColdFire Microprocessors
(Abstract)
Dale Amason
Alfred L. Crouch
Renny Eisele
Grady Giles
Michael Mateja
pp. 70-76
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Pentium Pro Processor Design for Test and Debug
(Abstract)
Adrian Carbine
Derek Feltham
pp. 77-82
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Testing the 500-MHz IBM S/390 Microprocessor
(Abstract)
Thomas G. Foote
Dale E. Hoffman
William V. Huott
Timothy J. Koprowski
Mary P. Kusko
Bryan J. Robbins
pp. 83-89
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Test Strategy for the PowerPC 750 Microprocessor
(Abstract)
Carol Pyron
Javier Prado
James Golab
pp. 90-97
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Alpha 21164 Manufacturing Test Development and Coverage Analysis
(Abstract)
Carol J. Stolicny
Richard Davies
Pamela McKernan
Tuyen Truong
pp. 98-104
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Special Feature
Effective Built-In Self-Test for Booth Multipliers
(Abstract)
Dimitris Gizopoulos
Antonis Paschalis
Yervant Zorian
pp. 105-111
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Rapid Hardware Prototyping on RPM-2
(Abstract)
Michel Dubois
Jaeheon Jeong
Yong Ho Song
Adrian Moga
pp. 112-118
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A D&T Roundtable: Challenges for Low-Power and High-Performance Chips
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pp. 119-124
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Test Technology TC Newsletter
(Abstract)
pp. 125-126
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Design Automation Technical Committee Newsletter
(Abstract)
pp. 126-127
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The Last Byte
Minutes Found on a Cave Wall
(Abstract)
Scott Davidson
pp. 128
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