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IEEE Design & Test of Computers
July-September 1997 (vol. 14 no. 3)
ISSN: 0740-7475
Table of Contents
EIC Message-Welcome ITC 97 Attendees
News (Abstract)
pp. 6,122
Panel Summaries
Conference Reports
VTS 97 Keynote
Guest Editors' Introduction
IC Diagnosis and Failure Analysis
Special Feature
DATC Newsletter
TTTC Newsletter
The Last Byte
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