Searching...
Advanced Search
Design&Test
1997
Issue No. 2 - April-June
This Publication
Digital Library
Advanced Search
This Publication
Subscribe to this Publication
Login to access your subscribed content
RSS feed for this Publication
Bibliographic References
ASCII Text
BibTex
RefWorks Procite/RefMan/EndNote
IEEE Design & Test of Computers
April-June 1997 (vol. 14 no. 2)
ISSN: 0740-7475
Table of Contents
Letters
VHDL fault injection questioned
(Abstract)
pp. 2-3
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
News
News
(Abstract)
pp. 3
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
Panel Summaries
IP-based business conflicts
(Abstract)
Ivo Bolsens
Marco Cecchini
pp. 4, 92
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
A D&T Profile
Adventures in the Mainframe Trade
(Abstract)
pp. 5-13
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
Guest Editors' Introduction
Guest Editor's Introduction: Design, Design Automation, and Test in Europe
(HTML)
Peter Marwedel
Carlos A. López-Barrio
pp. 14-15
ABSTRACT
PDF
HTML
Cosimulation and Compilation
System-on-a-Chip Cosimulation and Compilation
(Abstract)
Clifford Liem
François Naçabal
Carlos Valderrama
Pierre Paulin
Ahmed Jerraya
pp. 16-25
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Ram Address Decoders
Open Defects in CMOS RAM Address Decoders
(Abstract)
Manoj Sachdev
pp. 26-33
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Microsystem Cad
CAD Tools for Bridging Microsystems and Foundries
(Abstract)
Jean Michel Karam
Bernard Courtois
Hicham Boutamine
pp. 34-39
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
High-Level Synthesis
Observable Time Windows: Verifying High-Level Synthesis Results
(Abstract)
Reinaldo A. Bergamaschi
Salil Raje
pp. 40-50
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Features
The K*BMD: A Verification Data Structure
(Abstract)
Rolf Drechsler
Bernd Becker
Stefan Ruppertz
pp. 51-59
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Parity Prediction
Fault-Secure Parity Prediction Arithmetic Operators
(Abstract)
Michael Nicolaidis
Ricardo O. Duarte
Salvador Manich
Joan Figueras
pp. 60-71
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Digital System Design
Using a Programming Language for Digital System Design
(Abstract)
Rajesh K. Gupta
Stan Y. Liao
pp. 72-80
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
A D&T Roundtable
Testing Embedded Cores
(Abstract)
pp. 81-89
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
Author Guidelines
Author Guidelines IEEE Design & Test
(Abstract)
pp. 90-91
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
DATC Newsletter
Design Automation Technical Committee Newsletter
(Abstract)
pp. 93
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
TTTC Newsletter
Test Technology TC Newsletter
(Abstract)
pp. 94-95
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
The Last Byte
Why projects are late
(Abstract)
Scott Davidson
pp. 96
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
Peer Review Notice
|
Give Us Feedback
Usage of this product signifies your acceptance of the
Terms of Use
.
Open
Download
Print and Online Advertising Opportunities
