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Design&Test
1990
Issue No. 6 - November/December
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IEEE Design & Test of Computers
November/December 1990 (vol. 7 no. 6)
ISSN: 0740-7475
Table of Contents
D&T News
D&T News
(Abstract)
pp. 5-7, 41
ABSTRACT
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PURCHASE ARTICLE: $19
Features
What's Ahead for 1991?
(Abstract)
pp. 2-3
ABSTRACT
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PURCHASE ARTICLE: $19
Design Synthesis and Silicon Compilation
(Abstract)
Nikil D. Dutt
Daniel D. Gajski
pp. 8-23
ABSTRACT
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PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
A Model-Based Expert System for Digital System Design
(Abstract)
Jung-Gen Wu
Yu Hen Hu
William P.-C. Ho
David Y.Y. Yun
pp. 24-40
ABSTRACT
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PURCHASE ARTICLE: $19
IEEE
Xplore
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Dynamic Functional Testing for VLSI Circuits
(Abstract)
Peter M. Maurer
pp. 42-49
ABSTRACT
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PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
A D&T Roundtable: Synthesis for Testability
(Abstract)
pp. 50-59
ABSTRACT
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PURCHASE ARTICLE: $19
1990 Annual Index
(Abstract)
pp. 60-65
ABSTRACT
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PURCHASE ARTICLE: $19
TTTC Newsletter
TTTC Newsletter
(Abstract)
pp. 70-71
ABSTRACT
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PURCHASE ARTICLE: $19
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