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Design&Test
1990
Issue No. 2 - March/April
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IEEE Design & Test of Computers
March/April 1990 (vol. 7 no. 2)
ISSN: 0740-7475
Table of Contents
Features
Guest Editorial: ITC 20th Anniversary
(PDF)
M.R. Mercer
pp. 2-3
ABSTRACT
PDF
Integrating Tester Pin Electronics
(Abstract)
Christopher W. Branson
pp. 4-14
ABSTRACT
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PURCHASE ARTICLE: $19
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Low-Cost Testing of High-Density Logic Components
(Abstract)
Robert W. Bassett
Barry J. Butkus
Stephen L. Dingle
Marc R. Faucher
Pamela S. Gillis
Jeannie H. Panner
John G. Petrovick Jr.
Donald L. Wheater
pp. 15-28
ABSTRACT
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PURCHASE ARTICLE: $19
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Built-In Self-Test of the Macrolan Chip
(Abstract)
Richard Illman
Stephen Clarke
pp. 29-40
ABSTRACT
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PURCHASE ARTICLE: $19
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Implementing Macro Test in Silicon Compiler Design
(Abstract)
Frans Beenker
Barry J. Dekker
Richard Stans
Max Van der Star
pp. 41-51
ABSTRACT
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Serial Interfacing for Embedded-Memory Testing
(Abstract)
Benoit Nadeau-Dostie
Allan Silburt
Vinod K. Agarwal
pp. 52-63
ABSTRACT
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A D&T Roundtable: Behavioral Description Languages, Part 2: VHDL vs. UDL/I
(Abstract)
pp. 64-68
ABSTRACT
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PURCHASE ARTICLE: $19
TTTC Newsletter
TTTC Newsletter
(Abstract)
pp. 70-71
ABSTRACT
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PURCHASE ARTICLE: $19
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