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Design&Test
1987
Issue No. 4 - July/August
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Bibliographic References
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IEEE Design & Test of Computers
July/August 1987 (vol. 4 no. 4)
ISSN: 0740-7475
Table of Contents
Papers
International Test Conference 1987
(PDF)
pp. 4-14
ABSTRACT
PDF
ITC. The Only Serious Place for Test [advertisement]
(PDF)
pp. 41
ABSTRACT
PDF
IEEE Design&Test of Computers
(PDF)
pp. c1
ABSTRACT
PDF
`Real-Time' Solution to Asic Verification
(PDF)
pp. c2
ABSTRACT
PDF
Editorial Board
(PDF)
pp. 1
ABSTRACT
PDF
Table of Contents
(PDF)
pp. 2-3
ABSTRACT
PDF
Switch-Level Techniques
(PDF)
pp. 15-16
ABSTRACT
PDF
New for Network Designers
(PDF)
pp. 17
ABSTRACT
PDF
An Introduction to Switch-Level Modeling
(Abstract)
John Hayes
, University of Michigan
pp. 18-25
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
A Survey of Switch-Level Algorithms
(Abstract)
Randal Bryant
, Carnegie Mellon University
pp. 26-40
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Designing CMOS Circuits for Switch-Level Testability
(Abstract)
Dick Liu
, Stanford University
Edward McCluskey
, Stanford University
pp. 42-49
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
TTTC 10th Anniversary
(Abstract)
Paul Bardell
, Chair Test Technology TC
pp. 50-54
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Test Technology TC Membership
(PDF)
pp. 54
ABSTRACT
PDF
D&T Calendar
(PDF)
pp. 55
ABSTRACT
PDF
D&T Scene
(PDF)
pp. 56-59
ABSTRACT
PDF
Industry Briefs
(PDF)
pp. 58-59
ABSTRACT
PDF
D&T Standards
(PDF)
pp. 60
ABSTRACT
PDF
D&T Conferences
(PDF)
pp. 61-62
ABSTRACT
PDF
Call for Papers
(PDF)
pp. 63
ABSTRACT
PDF
New Products Design
(PDF)
pp. 64-67
ABSTRACT
PDF
New Products Test
(PDF)
pp. 68-70
ABSTRACT
PDF
The Computer Society
(PDF)
pp. 71
ABSTRACT
PDF
Advertiser/Product Index
(PDF)
pp. 72
ABSTRACT
PDF
There's More to Board Test Than Just Testing Boards
(PDF)
pp. 72-a-72-b
ABSTRACT
PDF
There's More to Board Test Than Just Testing Boards
(PDF)
pp. 72-c
ABSTRACT
PDF
Mixed Signal I.C. Test with a New Twist
(PDF)
pp. 72-d
ABSTRACT
PDF
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