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IEEE Design & Test of Computers
May/June 1987 (vol. 4 no. 3)
ISSN: 0740-7475
Table of Contents
Papers
David Ditzel, AT&T Bell Laboratories
Alan Berenbaum, AT&T Information Systems
pp. 21-31
H.h. Chao, IBM T. J. Watson Research Center
S. Ong, IBM T. J. Watson Research Center
M. Tsai, IBM T. J. Watson Research Center
F.w. Shih, IBM T. J. Watson Research Center
K.W. Lewis, IBM T. J. Watson Research Center
J. F. Tang, IBM T. J. Watson Research Center
C. Trempel, IBM T. J. Watson Research Center
H. Yu, IBM T. J. Watson Research Center
P.E. McCormick, IBM T. J. Watson Research Center
C. Davis, IBM T. J. Watson Research Center
A. Diamond, IBM T. J. Watson Research Center
T. Medve, IBM T. J. Watson Research Center
J. L. Hou, IBM T. J. Watson Research Center
pp. 32-40
Shoji Horiguchi, Nippon Telegraph and Telephone Corp.
Hiroshi Yoshimura, Nippon Telegraph and Telephone Corp.
Mitsuyoshi Nagatani, Nippon Telegraph and Telephone Corp.
Kennosuke Fukami, Nippon Telegraph and Telephone Corp.
pp. 52-58
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