CSDL - IEEE Design and Test of Computers

International Test Conference 1986 (PDF)

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International Test Conference (PDF)

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IEEE Design&Test of Computers (PDF)

pp. c1

Test Your Limits (PDF)

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The Speed of a Device Tester the Power of a Board Tester (PDF)

pp. 2-3

IEEE Computer Society (PDF)

pp. 4

Editorial Board (PDF)

pp. 5

From the Editor-in-Chief (PDF)

pp. 6

Finally a Logic Simulator That Keeps up with the Times (PDF)

pp. 7

Dedicated to Change (PDF)

pp. 8

Test Technology Newsletter (PDF)

pp. 9

D&T Scene (PDF)

pp. 10-11

Erratum (PDF)

pp. 11

About the Cover... (PDF)

pp. 11

Who Do You Suppose Offers the Most Cost-Effective Solution to All Your I.C. Component Testing Needs? (PDF)

pp. 12

The Future of Test (PDF)

pp. 13-14

A New Parallel Test Approach for Large Memories (Abstract)

Thirumalai Sridhar, Texas Instruments

pp. 15-22

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Integrating an Electron-Beam System into VLSI Fault Diagnosis (Abstract)

Teruo Tamama, NTT Electrical Communications Laboratories

Norio Kuji, NTT Electrical Communications Laboratories

pp. 23-29

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The State of the Art of Integrated Testing (PDF)

pp. 30-31

How to Make a Million Dollars Overnight (PDF)

pp. 32

Call for Papers ITC '87 Integration of Test with Design And Manufacturing (PDF)

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Test Week Tutorials (Abstract)

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1986 Program Overview (PDF)

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Achieving Accurate Timing Measurements on TTL/CMOS Devices (Abstract)

Dennis Petrich, Micro Component Technology

pp. 33-42

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SMART And FAST: Test Generation for VLSI Scan-Design Circuits (Abstract)

M. Abramovici, AT&T Information Systems

J.J. Kulikowski, AT&T Information Systems

P.R. Menon, AT&T Information Systems

D.T. Miller, AT&T Information Systems

pp. 43-54

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American Technology. More Than Grasping at Straws (PDF)

pp. 55

Test Considerations for Gate Oxide Shorts in CMOS ICs (Abstract)

Jerry Soden, Sandia National Laboratories

Charles Hawkins, University of New Mexico

pp. 56-64

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Tutorial?Integrated Services Digital Networks (ISDN) (PDF)

pp. 64

D&T Standards (PDF)

pp. 65

IEEE International Conference on Computer Design: VLSI in Computers (PDF)

pp. 66-67

D&T Conferences (PDF)

pp. 68-70

Proceedings-Microprogramming Workshop (MICRO-18) (PDF)

pp. 70

Now, Your Computer And Communications Network Analysis Simplified (PDF)

pp. 71

New Products Design (PDF)

J. Nash, Raytheon Co., Missile Systems Div., Hartwell Rd., Bedford, MA 01730

pp. 72

New Products Test (PDF)

Conrad Zagwyn, LTX Corporation/LXT at University/Westwood, MA 02090

pp. 73-75

Book Reviews (PDF)

Robert Anderson, GenRad Inc., PO Box 32183, Phoenix, AZ 85064

pp. 76-77

Proceedings?International Workshop on Timed Petri Nets (PDF)

pp. 77

Calendar (PDF)

pp. 78

Call for Papers (PDF)

pp. 79

Advertiser Index? August 1986 (PDF)

pp. 80

IEEE Design&Test of Computers (PDF)

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Freezing! (PDF)

pp. 80-c

Now, a Supercomputer Simulation Engine for Just $1520 a Month (PDF)

pp. 80-d