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IEEE Design & Test of Computers
May/June 1986 (vol. 3 no. 3)
ISSN: 0740-7475
Table of Contents
K.L. Kodandapani, Digital Equipment Corporation
Edward McGrath, Digital Equipment Corporation
pp. 46-51
J. Nash, Raytheon Co., Missile Systems Div., Hartwell Rd., Bedford, MA 01730.
pp. 65-67
Conard Zagwyn, International Test Conference, 295 Valley St., Pembroke, MA 02359
pp. 68-69
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