Advanced Search 
IEEE Transactions on Software Engineering
Sept.-Oct. 2008 (vol. 34 no. 5)
ISSN: 0098-5589
Table of Contents
SPECIAL SECTION on the International Symposium on Software Testing and Analysis
Ray-Yaung Chang, Case Western Reserve University, Cleveland
Andy Podgurski, Case Western Reserve University, Cleveland
Jiong Yang, Case Western Reserve University, Cleveland
pp. 579-596
Marcelo d'Amorim, University of Illinois at Urbana-Champaign, Urbana
Steven Lauterburg, University of Illinois at Urbana-Champaign, Urbana
Darko Marinov, University of Illinois at Urbana-Champaign, Urbana
pp. 597-613
Graham Hughes, University of California, Santa Barbara, Santa Barbara
Tevfik Bultan, University of California, Santa Barbara, Santa Barbara
pp. 614-632
Myra B. Cohen, University of Nebraska-Lincoln, Lincoln
Matthew B. Dwyer, University of Nebraska-Lincoln, Lincoln
Jiangfan Shi, University of Nebraska-Lincoln, Lincoln
pp. 633-650
Sharon Shoham, Technion, Haifa
Eran Yahav, IBM Research, Hawthorne
Stephen J. Fink, IBM Research, Hawthorne
Marco Pistoia, IBM Research, Hawthorne
pp. 651-666
Regular Papers
Yann-Gaël Guéhéneuc, University Montreal, Montreal
Giuliano Antoniol, Ecole Polytechnique de Montreal, Montreal
pp. 667-684
Jane Cleland-Huang, DePaul University, Chicago
Will Marrero, DePaul University, Chicago
Brian Berenbach, Siemens Corporate Research, Inc., Princeton
pp. 685-699
Santonu Sarkar, Infosys Technologies Ltd, Bangalore
Avinash C. Kak, Purdue University, West Lafayette
Girish Maskeri Rama, Infosys Technologies Ltd, Bangalore
pp. 700-720
Usage of this product signifies your acceptance of the Terms of Use.