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| Jiang Zheng, Laurie Williams, Nachiappan Nagappan, Will Snipes, John P. Hudepohl, Mladen A. Vouk, "On the Value of Static Analysis for Fault Detection in Software," IEEE Transactions on Software Engineering, vol. 32, no. 4, pp. 240-253, April, 2006. | |||
| BibTex | x | ||
| @article{ 10.1109/TSE.2006.38, author = {Jiang Zheng and Laurie Williams and Nachiappan Nagappan and Will Snipes and John P. Hudepohl and Mladen A. Vouk}, title = {On the Value of Static Analysis for Fault Detection in Software}, journal ={IEEE Transactions on Software Engineering}, volume = {32}, number = {4}, issn = {0098-5598}, year = {2006}, pages = {240-253}, doi = {http://doi.ieeecomputersociety.org/10.1109/TSE.2006.38}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Software Engineering TI - On the Value of Static Analysis for Fault Detection in Software IS - 4 SN - 0098-5598 SP240 EP253 EPD - 240-253 A1 - Jiang Zheng, A1 - Laurie Williams, A1 - Nachiappan Nagappan, A1 - Will Snipes, A1 - John P. Hudepohl, A1 - Mladen A. Vouk, PY - 2006 KW - Code inspections KW - walkthroughs. VL - 32 JA - IEEE Transactions on Software Engineering ER - | |||
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