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| K.C. Tai, Y. Lie, "A Test Generation Strategy for Pairwise Testing," IEEE Transactions on Software Engineering, vol. 28, no. 1, pp. 109-111, January, 2002. | |||
| BibTex | x | ||
| @article{ 10.1109/32.979992, author = {K.C. Tai and Y. Lie}, title = {A Test Generation Strategy for Pairwise Testing}, journal ={IEEE Transactions on Software Engineering}, volume = {28}, number = {1}, issn = {0098-5589}, year = {2002}, pages = {109-111}, doi = {http://doi.ieeecomputersociety.org/10.1109/32.979992}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Software Engineering TI - A Test Generation Strategy for Pairwise Testing IS - 1 SN - 0098-5589 SP109 EP111 EPD - 109-111 A1 - K.C. Tai, A1 - Y. Lie, PY - 2002 KW - software testing KW - pairwise testing KW - test generation VL - 28 JA - IEEE Transactions on Software Engineering ER - | |||
Pairwise testing is a specification-based testing criterion, which requires that for each pair of input parameters of a system, every combination of valid values of these two parameters be covered by at least one test case. In this paper, we propose a new test generation strategy for pairwise testing.
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