|
| This Article | ||
| ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
 Digg  Furl  Spurl  Blink  Simpy  Google  Del.icio.us  Y!MyWeb | ||
| Search | ||
| ||
| ASCII Text | x | ||
| Sanping Chen, Shirley Mills, "A Binary Markov Process Model for Random Testing," IEEE Transactions on Software Engineering, vol. 22, no. 3, pp. 218-223, March, 1996. | |||
| BibTex | x | ||
| @article{ 10.1109/32.489081, author = {Sanping Chen and Shirley Mills}, title = {A Binary Markov Process Model for Random Testing}, journal ={IEEE Transactions on Software Engineering}, volume = {22}, number = {3}, issn = {0098-5589}, year = {1996}, pages = {218-223}, doi = {http://doi.ieeecomputersociety.org/10.1109/32.489081}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Software Engineering TI - A Binary Markov Process Model for Random Testing IS - 3 SN - 0098-5589 SP218 EP223 EPD - 218-223 A1 - Sanping Chen, A1 - Shirley Mills, PY - 1996 KW - Binary Markov process KW - dependent test runs KW - random testing KW - software reliability KW - statistical testing KW - ultra-reliability application. VL - 22 JA - IEEE Transactions on Software Engineering ER - | |||
Abstract—In this work a binary Markov process model is proposed for random testing for software. This model is suggested to replace the standard binomial distribution model, which is based on the easily-violated assumption of test runs being statistically independent of each other. In addition to a general result on the probability of having any specific number of software failures during testing, practical implications of the new model are also discussed. In particular, we demonstrate that in general the effect of possible correlation between test runs cannot be ignored in estimating software reliability.
[1] L.W. Crow and N.D. Singpurwalla, "An Empirically Developed Fourier Series Model for Describing Software Failures," IEEE Trans. Reliability, vol. 33, pp. 438-444, 1984.
[2] P.A. Currit, M. Dyer, and H.D. Mills, “Certifying the Reliability of Software,” IEEE Trans. Software Eng., Jan. 1986, pp. 3-11.
[3] J.W. Duran and S.C. Ntafos, "An Evaluation of Random Testing," IEEE Trans. Software Engineering, vol. 10, no. 4, pp. 438-444, 1984.
[4] M. Dyer, "A formal approach to software error removal," J. Systems Software, 1987.
[5] W.D. Ehrenberger, "Statistical Testing of Real Time Software," Verification and Validation of Real-Time Software. W.J. Quirk, ed., Berlin: Springer-Verlag, 1985.
[6] E. Girard and J.C. Rault, "A Programming Technique for Software Reliability," Conf. Record IEEE Symp. Computer Software Reliability, pp. 40-50, 1973.
[7] W.E. Howden, Functional Program Testing Analysis. McGraw-Hill, 1987.
[8] N.G. Leveson, "Software Safety in Embedded Computer Systems," Comm. ACM, vol. 34, no. 2, pp. 34-46, 1991.
[9] B. Littlewood and D. Wright, "Stopping Rules for the Operational Testing of Safety-Critical Software," Digest of IEEE 1995 FTCS, 25th Ann. Int'l Symp. Fault-Tolerant Computing, IEEE Computer Society, Silver Spring, Md., pp. 444-451, 1995.
[10] G.J. Myers,The Art of Software Testing.New York: Wiley, 1979.
[11] J.D. Musa,A. Iannino,, and K. Okumoto,Software Reliability: Measurement, Prediction and Application.New York: McGraw-Hill, 1987.
[12] D.L. Parnas, A.J. van Schouwen, and S.P. Kwan, "Evaluation of safety-critical software," Comm. ACM, vol. 33, no.6, pp. 636-648, June 1990.
[13] R.P. Taylor, S. Mills, S. Chen, and S. El-Saadany, "Reliability Assessment for Safety Critical Systems," Proc. 12th Canadian Nuclear Soc. Conf., pp. 383-388, June 1991.
[14] R.A. Thayer, M. Lipow, and E.C. Nelson, Software Reliability, NorthHolland, 1978.