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Software Reliability Model with Optimal Selection of Failure Data
November 1993 (vol. 19 no. 11)
pp. 1095-1104

The possibility of obtaining more accurate predictions of future failures by excluding or giving lower weight to the earlier failure counts is suggested. Although data aging techniques such as moving average and exponential smoothing are frequently used in other fields, such as inventory control, the author did not find use of data aging in the various models surveyed. A model that includes the concept of selecting a subset of the failure data is the Schneidewind nonhomogeneous Poisson process (NHPP) software reliability model. In order to use the concept of data aging, there must be a criterion for determining the optimal value of the starting failure count interval. Four criteria for identifying the optimal starting interval for estimating model parameters are evaluated The first two criteria treat the failure count interval index as a parameter by substituting model functions for data vectors and optimizing on functions obtained from maximum likelihood estimation techniques. The third uses weighted least squares to maintain constant variance in the presence of the decreasing failure rate assumed by the model. The fourth criterion is the familiar mean square error. It is shown that significantly improved reliability predictions can be obtained by using a subset of the failure data. The US Space Shuttle on-board software is used as an example.

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Index Terms:
software reliability model; failure data; failure counts; moving average; data aging techniques; exponential smoothing; Schneidewind nonhomogeneous Poisson process; failure count interval index; data vectors; weighted least squares; constant variance; mean square error; US Space Shuttle on-board software; NHPP software reliability; aerospace computing; maximum likelihood estimation; software reliability; space vehicles
Citation:
N.F. Schneidewind, "Software Reliability Model with Optimal Selection of Failure Data," IEEE Transactions on Software Engineering, vol. 19, no. 11, pp. 1095-1104, Nov. 1993, doi:10.1109/32.256856
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