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| T.-J. Yu, V.Y. Shen, H.E. Dunsmore, "An Analysis of Several Software Defect Models," IEEE Transactions on Software Engineering, vol. 14, no. 9, pp. 1261-1270, September, 1988. | |||
| BibTex | x | ||
| @article{ 10.1109/32.6170, author = {T.-J. Yu and V.Y. Shen and H.E. Dunsmore}, title = {An Analysis of Several Software Defect Models}, journal ={IEEE Transactions on Software Engineering}, volume = {14}, number = {9}, issn = {0098-5589}, year = {1988}, pages = {1261-1270}, doi = {http://doi.ieeecomputersociety.org/10.1109/32.6170}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Software Engineering TI - An Analysis of Several Software Defect Models IS - 9 SN - 0098-5589 SP1261 EP1270 EPD - 1261-1270 A1 - T.-J. Yu, A1 - V.Y. Shen, A1 - H.E. Dunsmore, PY - 1988 KW - software testing; software reliability; software defect models; mathematical model; software development; programming theory; software reliability VL - 14 JA - IEEE Transactions on Software Engineering ER - | |||
Results are presented of an analysis of several defect models using data collected from two large commercial projects. Traditional models typically use either program matrices (i.e. measurements from software products) or testing time or combinations of these as independent variables. The limitations of such models have been well-documented. The models considered use the number of defects detected in the earlier phases of the development process as the independent variable. This number can be used to predict the number of defects to be detected later, even in modified software products. A strong correlation between the number of earlier defects and that of later ones was found. Using this relationship, a mathematical model was derived which may be used to estimate the number of defects remaining in software. This defect model may also be used to guide software developers in evaluating the effectiveness of the software development and testing processes.
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