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Issue No.12 - December (vol.11)
ISSN: 0098-5589
TABLE OF CONTENTS
Papers
A.L. Goel , Department of Electrical and Computer Engineering and the School of Computer and Information Science, Syracuse University
pp. 1411-1423
K. Okumoto , AT&T Bell Laboratories
pp. 1424-1430
S. Yamada , Graduate School of Systems Science, Okayama University of Science
pp. 1431-1437
R.K. Iyer , Computer Systems Group, Coordinated Science Laboratory and the Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign
pp. 1438-1448
J.P. Cavano , Rome Air Development Center
pp. 1449-1455
N.D. Singpurwalla , Institute for Reliability and Risk Analysis, School of Engineering and Applied Science, George Washington University
pp. 1456-1464
W.S. Jewell , Department of Industrial Engineering and Operations Research, University of California
pp. 1465-1471
S.M. Ross , Department of Industrial Engineering and Operations Research, University of California
pp. 1472-1476
D.J. Richardson , Department of Computer and Information Science, University of Massachusetts
pp. 1477-1490
A. Avizienis , Department of Computer Science, University of California
pp. 1491-1501
T. Anderson , Centre for Software Reliability, University of Newcastle upon Tyne
pp. 1502-1510
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