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Experience with Path Analysis and Testing of Programs
May 1980 (vol. 6 no. 3)
pp. 278-286
ASCII Text
x 
 
M.R. Woodward, D. Hedley, M.A. Hennell, "Experience with Path Analysis and Testing of Programs," IEEE Transactions on Software Engineering, vol. 6, no. 3, pp. 278-286, May, 1980.
 
 
BibTex
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@article{ 10.1109/TSE.1980.230473,
author = {M.R. Woodward and D. Hedley and M.A. Hennell},
title = {Experience with Path Analysis and Testing of Programs},
journal ={IEEE Transactions on Software Engineering},
volume = {6},
number = {3},
issn = {0098-5589},
year = {1980},
pages = {278-286},
doi = {http://doi.ieeecomputersociety.org/10.1109/TSE.1980.230473},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - JOUR
JO - IEEE Transactions on Software Engineering
TI - Experience with Path Analysis and Testing of Programs
IS - 3
SN - 0098-5589
SP278
EP286
EPD - 278-286
A1 - M.R. Woodward,
A1 - D. Hedley,
A1 - M.A. Hennell,
PY - 1980
KW - test metrics
KW - Alegations
KW - infeasible paths
KW - path testing
VL - 6
JA - IEEE Transactions on Software Engineering
ER -
 
M.R. Woodward, Department of Computational and Statistical Science, University of Uverpool
There are a number of practical difficulties in performing a path testing strategy for computer programs. One problem is in deciding which paths, out of a possible infinity, to use as test cases. A hierarchy of structural test metrics is suggested to direct the choide and to monitor the coverge of test paths. Another problem is that many of the chosen paths may be infeasible in the sense that no test data can ever execute them. Experience with the use of "allegations" to circumvent this problem and prevent the static generation of many infeasible paths is reported.
Index Terms:
test metrics, Alegations, infeasible paths, path testing
Citation:
M.R. Woodward, D. Hedley, M.A. Hennell, "Experience with Path Analysis and Testing of Programs," IEEE Transactions on Software Engineering, vol. 6, no. 3, pp. 278-286, May 1980, doi:10.1109/TSE.1980.230473
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