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| B. Chandrasekaran, "Guest Editorial Special Collection on Program Testing," IEEE Transactions on Software Engineering, vol. 6, no. 3, pp. 233-235, May, 1980. | |||
| BibTex | x | ||
| @article{ 10.1109/TSE.1980.234484, author = {B. Chandrasekaran}, title = {Guest Editorial Special Collection on Program Testing}, journal ={IEEE Transactions on Software Engineering}, volume = {6}, number = {3}, issn = {0098-5589}, year = {1980}, pages = {233-235}, doi = {http://doi.ieeecomputersociety.org/10.1109/TSE.1980.234484}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Software Engineering TI - Guest Editorial Special Collection on Program Testing IS - 3 SN - 0098-5589 SP233 EP235 EPD - 233-235 A1 - B. Chandrasekaran, PY - 1980 KW - null VL - 6 JA - IEEE Transactions on Software Engineering ER - | |||
THIS special collection had its genesis at the IEEE Computer Society Workshop on Software Testing and Test Documentation, held in Fort Lauderdale, Florida, during December 18-20, 1978. This collection is devoted to selected papers on program testing that were presented at the Workshop. It contains six papers whose concerns span a wide range: theoretical issues, practical expenence With particular strategies, extension of a class of techniques to new classes of language constructs, and building integrated test tools. In the next section, we present an overview of the papers in the collection.
Citation:
B. Chandrasekaran, "Guest Editorial Special Collection on Program Testing," IEEE Transactions on Software Engineering, vol. 6, no. 3, pp. 233-235, May 1980, doi:10.1109/TSE.1980.234484
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