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Rajaraman Ramanarayanan, Vijay Degalahal, Ramakrishnan Krishnan, Jung Sub Kim, Vijaykrishnan Narayanan, Yuan Xie, Mary Jane Irwin, Kenan Unlu, "Modeling Soft Errors at the Device and Logic Levels for Combinational Circuits," IEEE Transactions on Dependable and Secure Computing, vol. 6, no. 3, pp. 202216, JulySeptember, 2009.  
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@article{ 10.1109/TDSC.2007.70231, author = {Rajaraman Ramanarayanan and Vijay Degalahal and Ramakrishnan Krishnan and Jung Sub Kim and Vijaykrishnan Narayanan and Yuan Xie and Mary Jane Irwin and Kenan Unlu}, title = {Modeling Soft Errors at the Device and Logic Levels for Combinational Circuits}, journal ={IEEE Transactions on Dependable and Secure Computing}, volume = {6}, number = {3}, issn = {15455971}, year = {2009}, pages = {202216}, doi = {http://doi.ieeecomputersociety.org/10.1109/TDSC.2007.70231}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
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TY  JOUR JO  IEEE Transactions on Dependable and Secure Computing TI  Modeling Soft Errors at the Device and Logic Levels for Combinational Circuits IS  3 SN  15455971 SP202 EP216 EPD  202216 A1  Rajaraman Ramanarayanan, A1  Vijay Degalahal, A1  Ramakrishnan Krishnan, A1  Jung Sub Kim, A1  Vijaykrishnan Narayanan, A1  Yuan Xie, A1  Mary Jane Irwin, A1  Kenan Unlu, PY  2009 KW  Soft errors KW  modeling KW  SoftError Analysis toolset KW  logic KW  device. VL  6 JA  IEEE Transactions on Dependable and Secure Computing ER   
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