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Multi-View Face Detection and Registration Requiring Minimal Manual Intervention
PrePrint
ISSN: 0162-8828
Seyed Mohammad Hassan Anvar, Nanyang Technological University and the Institute for Infocomm Research, Singapore
Wei-Yun Yau, Institute for Infocomm Research, A*STAR, Singapore
Eam Khwang Teoh, Nanyang Technological University, Singapore
Most face recognition systems require faces to be detected and localized a priori. In this paper, an approach to simultaneously detect and localize multiple faces having arbitrary views and different scales is proposed. The main contribution of this paper is the introduction of a face constellation, which enables multi-view face detection and localization. In contrast to other multi-view approaches that require many manually labeled images for training, the proposed face constellation requires only a single reference image of a face containing two manually indicated reference points for initialization. Subsequent training face images from arbitrary views are automatically added to the constellation (registered to the reference image) based on finding the correspondences between distinctive local features. Thus, the key advantage of the proposed scheme is the minimal manual intervention required to train the face constellation. We also propose an approach to identify distinctive correspondence points between pairs of face images in the presence of a large amount of false matches. To detect and localize multiple faces with arbitrary views, we then propose a probabilistic classifier based formulation to evaluate whether a local feature cluster corresponds to a face.
Index Terms:
Face,Feature extraction,Face detection,Training,Detectors,Manuals,Face recognition,Model Development,Computing Methodologies,Pattern Recognition,Applications,Face and gesture recognition,Models,Statistical,Computer vision,Simulation,Modeling,and Visualization
Citation:
Seyed Mohammad Hassan Anvar, Wei-Yun Yau, Eam Khwang Teoh, "Multi-View Face Detection and Registration Requiring Minimal Manual Intervention," IEEE Transactions on Pattern Analysis and Machine Intelligence, 25 Feb. 2013. IEEE computer Society Digital Library. IEEE Computer Society, <http://doi.ieeecomputersociety.org/10.1109/TPAMI.2013.37>
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