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Issue No.04 - April (vol.36)
ISSN: 0162-8828
TABLE OF CONTENTS
pp. C1
Junghyun Kwon , TeleSecurity Sci., Inc., Las Vegas, NV, USA
Hee Seok Lee , Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
Frank C. Park , Sch. of Mech. & Aerosp. Eng., Seoul Nat. Univ., Seoul, South Korea
Kyoung Mu Lee , Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
pp. 625-643
Ezequiel Lopez-Rubio , Dept. of Comput. Languages & Comput. Sci., Univ. of Malaga, Málaga, Spain
pp. 644-656
Shu Liao , Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
Dinggang Shen , Dept. of Radiol., Univ. of North Carolina at Chapel Hill, Chapel Hill, NC, USA
Albert C. S. Chung , Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
pp. 657-669
Tom S. F. Haines , Dept. of Comput. Sci., Univ. Coll. London, London, UK
Tao Xiang , Sch. of Electron. Eng. & Comput. Sci., Queen Mary Univ. of London, London, UK
pp. 670-683
Raul Mohedano , Grupo de Tratamiento de Imagenes, Univ. Politec. de Madrid, Madrid, Spain
Andrea Cavallaro , Centre for Intell. Sensing, Queen Mary Univ. of London, London, UK
Narciso Garcia , Grupo de Tratamiento de Imagenes, Univ. Politec. de Madrid, Madrid, Spain
pp. 684-697
Nicolas Gillis , Dept. of Math. & Operational Res., Univ. de Mons, Mons, Belgium
Stephen A. Vavasis , Dept. of Combinatorics & Optimization, Univ. of Waterloo, Waterloo, ON, Canada
pp. 698-714
Ning Zhou , Dept. of Comput. Sci., Univ. of North Carolina at Charlotte, Charlotte, NC, USA
Jianping Fan , Dept. of Comput. Sci., Univ. of North Carolina at Charlotte, Charlotte, NC, USA
pp. 715-730
Karel Zimmermann , Dept. of Cybern., Czech Tech. Univ. in Prague, Prague, Czech Republic
David Hurych , Dept. of Cybern., Czech Tech. Univ. in Prague, Prague, Czech Republic
Tomas Svoboda , Dept. of Cybern., Czech Tech. Univ. in Prague, Prague, Czech Republic
pp. 731-743
Tiezheng Ge , Univ. of Sci. & Technol. of China, Hefei, China
Kaiming He , Visual Comput. Group, Microsoft Res. Asia, Beijing, China
Qifa Ke , Microsoft Bing, Sunnyvale, CA, USA
Jian Sun , Visual Comput. Group, Microsoft Res. Asia, Beijing, China
pp. 744-755
Lu Zhang , Dept. of Intell. Syst., Delft Univ. of Technol., Delft, Netherlands
Laurens J. P. van der Maaten , Dept. of Intell. Syst., Delft Univ. of Technol., Delft, Netherlands
pp. 756-769
Ran He , Center for Res. on Intell. Perception & Comput., Inst. of Autom., Beijing, China
Tieniu Tan , Center for Res. on Intell. Perception & Comput., Inst. of Autom., Beijing, China
Liang Wang , Center for Res. on Intell. Perception & Comput., Inst. of Autom., Beijing, China
pp. 770-783
Kevin J. Cannons , Dept. of Comput. Sci. & Eng., York Univ., Toronto, ON, Canada
Richard P. Wildes , Dept. of Comput. Sci. & Eng., York Univ., Toronto, ON, Canada
pp. 784-796
David Vazquez , Centro de Vision Por Computador-Edificio O, Univ. Autonoma de Barcelona, Bellaterra, Spain
Antonio M. Lopez , Centro de Vision Por Computador-Edificio O, Univ. Autonoma de Barcelona, Bellaterra, Spain
Javier Marin , Centro de Vision Por Computador-Edificio O, Univ. Autonoma de Barcelona, Bellaterra, Spain
Daniel Ponsa , Centro de Vision Por Computador-Edificio O, Univ. Autonoma de Barcelona, Bellaterra, Spain
David Geronimo , Centro de Vision Por Computador-Edificio O, Univ. Autonoma de Barcelona, Bellaterra, Spain
pp. 797-809
Xiaogang Wang , Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Shi Qiu , Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Shatin, China
Ke Liu , Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Shatin, China
Xiaoou Tang , Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
pp. 810-823
Jonathan Masci , Swiss AI Lab. (IDSIA), Univ. of Lugano (USI), Lugano, Switzerland
Michael M. Bronstein , Inst. of Comput. Sci., Univ. of Lugano (USI), Lugano, Switzerland
Alexander M. Bronstein , Sch. of Electr. Eng., Tel Aviv Univ., Tel Aviv, Israel
Jürgen Schmidhuber , Swiss AI Lab. (IDSIA), Univ. of Lugano (USI), Lugano, Switzerland
pp. 824-830
Open Access (PDF)
pp. 831
myIEEE (PDF)
pp. 832
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