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IEEE Transactions on Pattern Analysis and Machine Intelligence
Feb. 2014 (vol. 36 no. 2)
ISSN: 0162-8828
Table of Contents
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REGULAR PAPERS
Naejin Kong, Korea Advanced Institute of Science and Technology, Daejeon
Yu-Wing Tai, Korea Advanced Institute of Science and Technology, Daejeon
Joseph S. Shin, Korea Advanced Institute of Science and Technology, Daejeon
pp. 209-221
Ian Endres, University of Illinois at Urbana-Champaign, Urbana
Derek Hoiem, University of Illinois at Urbana-Champaign, Urbana
pp. 222-234
Makoto Yamada, NTT Communication Science Laboratories, Kidugawa
Leonid Sigal, Disney Research, Pittsburgh
Michalis Raptis, Disney Research, Pittsburgh
pp. 235-247
Dengyu Liu, Rochester Institute of Technology, Rochester
Jinwei Gu, Rochester Institute of Technology, Rochester
Yasunobu Hitomi, Sony Corporation, Tokyo
Mohit Gupta, Columbia University, New York
Tomoo Mitsunaga, Sony Corporation, Tokyo
Shree K. Nayar, Columbia University, New York
pp. 248-260
Ran He, Institute of Automation, Chinese Academy of Sciences, Beijing
Wei-Shi Zheng, Sun Yat-sen University, Guangzhou
Tieniu Tan, Institute of Automation, Chinese Academy of Sciences, Beijing
Zhenan Sun, Institute of Automation, Chinese Academy of Sciences, Beijing
pp. 261-275
Sudheendra Vijayanarasimhan, University of Texas at Austin, Austin
Prateek Jain, Machine Learning Group at Microsoft Research, Bangalore
Kristen Grauman, University of Texas at Austin, Austin
pp. 276-288
Zhen Lei, Institute of Automation, Chinese Academy of Sciences, Beijing
Matti Pietikainen, University of Oulu, Oulu
Stan Z. Li, Institute of Automation, Chinese Academy of Sciences, Beijing
pp. 289-302
Yanwei Fu, Queen Mary University of London, London
Timothy M. Hospedales, Queen Mary University of London, London
Tao Xiang, Queen Mary University of London, London
Shaogang Gong, Queen Mary University of London, London
pp. 303-316
Yacov Hel-Or, The Interdisciplinary Center, Herzliya
Hagit Hel-Or, University of Haifa, Haifa
Eyal David, University of Haifa, Haifa
pp. 317-330
Jiwen Lu, Advanced Digital Sciences Center, Singapore
Xiuzhuang Zhou, Captial Normal University, Beijing
Yap-Pen Tan, Nanyang Technological University, Singapore
Yuanyuan Shang, Captial Normal University, Beijing
Jie Zhou, Tsinghua University, Beijing
pp. 331-345
Ce Liu, Microsoft Res. New England, Cambridge, UK
Deqing Sun, Pfister Group, Harvard Univ., Cambridge, MA, USA
pp. 346-360
Xiaogang Wang, The Chinese University of Hong Kong, Hong Kong
Meng Wang, the Chinese University of Hong Kong, Hong Kong
Wei Li, the Chinese University of Hong Kong, Hong Kong
pp. 361-374
Jerod J. Weinman, Grinnell College, Grinnell
Zachary Butler, Grinnell College, Grinnell
Dugan Knoll, Grinnell College, Grinnell
Jacqueline Feild, University of Massachusetts, Amherst
pp. 375-387
Jingdong Wang, Microsoft Research Aisa, Beijing
Naiyan Wang, The Hong Kong University of Science and Technology, Hong Kong
You Jia, Carnegie Mellon University, Pittsburgh
Jian Li, Tsinghua University, Beijing
Gang Zeng, Peking University, Beijing
Hongbin Zha, Peking University, Beijing
Xian-Sheng Hua, Microsoft Corporation, Bellevue
pp. 388-403
Du Tran, Dartmouth College, Hanover
Junsong Yuan, Nanyang Technological University, Singapore
David Forsyth, University of Illinois at Urbana Champaign, Urbana
pp. 404-416
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