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IEEE Transactions on Pattern Analysis and Machine Intelligence
Nov. 2013 (vol. 35 no. 11)
ISSN: 0162-8828
Table of Contents
Front Covers
REGULAR PAPERS
C. Poullis, Immersive & Creative Technol. Lab., Cyprus Univ. of Technol., Limassol, Cyprus
pp. 2563-2575
Mei Chee Leong, Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore, Singapore
Yong Tsui Lee, Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore, Singapore
Fen Fang, Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore, Singapore
pp. 2576-2591
G. Carneiro, Australian Centre for Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
J. C. Nascimento, Inst. de Sist. e Robot., Inst. Super. Tecnico, Lisbon, Portugal
pp. 2592-2607
M. Zeeshan Zia, Photogrammetry & Remote Sensing Lab., ETH Zurich, Zurich, Switzerland
M. Stark, Dept. of Comput. Sci., Stanford Univ., Stanford, CA, USA
B. Schiele, Comput. Vision & Multimodal Comput. Lab., Max-Planck-Inst. fur Inf., Saarbrucken, Germany
K. Schindler, Photogrammetry & Remote Sensing Lab., ETH Zurich, Zurich, Switzerland
pp. 2608-2623
T. Mensink, ISLA Lab., Univ. of Amsterdam, Amsterdam, Netherlands
J. Verbeek, LEAR Team, INRIA Grenoble, Grenoble, France
F. Perronnin, Xerox Res. Centre Eur. Grenoble, Meylan, France
G. Csurka, Xerox Res. Centre Eur. Grenoble, Meylan, France
pp. 2624-2637
L. Cordero-Grande, Dept. of Teor. de la Senal y Comun. e Ing. Telematica, Univ. de Valladolid, Valladolid, Spain
S. Merino-Caviedes, Dept. of Teor. de la Senal y Comun. e Ing. Telematica, Univ. de Valladolid, Valladolid, Spain
S. Aja-Fernandez, Dept. of Teor. de la Senal y Comun. e Ing. Telematica, Univ. de Valladolid, Valladolid, Spain
C. Alberola-Lopez, Dept. of Teor. de la Senal y Comun. e Ing. Telematica, Univ. de Valladolid, Valladolid, Spain
pp. 2638-2650
Zhuolin Jiang, Inst. for Adv. Comput. Studies, Univ. of Maryland, College Park, MD, USA
Zhe Lin, Adv. Technol. Labs., Adobe, San Jose, CA, USA
L. S. Davis, Inst. for Adv. Comput. Studies, Univ. of Maryland, College Park, MD, USA
pp. 2651-2664
N. Rasiwasia, Yahoo! Labs. Bangalore, Bangalore, India
N. Vasconcelos, Univ. of California San Diego, La Jolla, CA, USA
pp. 2665-2679
S. Melacci, Dept. of Inf. Eng. & Math. Sci., Univ. of Siena, Siena, Italy
M. Gori, Dept. of Inf. Eng. & Math. Sci., Univ. of Siena, Siena, Italy
pp. 2680-2692
J. A. Perez-Carrasco, Dept. Teor. de la Senal y Comun., Univ. of Sevilla, Sevilla, Spain
Bo Zhao, Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
C. Serrano, Dept. Teor. de la Senal y Comun., Univ. of Sevilla, Sevilla, Spain
B. Acha, Dept. Teor. de la Senal y Comun., Univ. of Sevilla, Sevilla, Spain
T. Serrano-Gotarredona, Inst. de Microelectron. de Sevilla, Sevilla, Spain
Shouchun Chen, Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
B. Linares-Barranco, Inst. de Microelectron. de Sevilla, Sevilla, Spain
pp. 2706-2719
Yebin Liu, Autom. Dept., Tsinghua Univ., Beijing, China
J. Gall, Perceiving Syst. Dept., Max Planck Inst. for Intell. Syst., Tubingen, Germany
C. Stoll, Max Planck Inst. for Inf., Saarland Univ., Saarbrucken, Germany
Qionghai Dai, Autom. Dept., Tsinghua Univ., Beijing, China
Hans-Peter Seidel, Max Planck Inst. for Inf., Saarland Univ., Saarbrucken, Germany
C. Theobalt, Max Planck Inst. for Inf., Saarland Univ., Saarbrucken, Germany
pp. 2720-2735
N. Chenouard, Quantitative Image Anal. Unit, Inst. Pasteur, Paris, France
I. Bloch, LTCI, Telecom ParisTech, Paris, France
J. Olivo-Marin, Quantitative Image Anal. Unit, Inst. Pasteur, Paris, France
pp. 2736-3750
V. Badrinarayanan, Dept. of Eng., Univ. of Cambridge, Cambridge, UK
I. Budvytis, Dept. of Eng., Univ. of Cambridge, Cambridge, UK
R. Cipolla, Dept. of Eng., Univ. of Cambridge, Cambridge, UK
pp. 2751-2764
E. Elhamifar, Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, Berkeley, CA, USA
R. Vidal, Dept. of Biomed. Eng., Johns Hopkins Univ., Baltimore, MD, USA
pp. 2765-2781
A. Gaidon, Xerox Res. Centre Eur., Meylan, France
Z. Harchaoui, INRIA Grenoble Rhone-Alpes, Montbonnot, France
C. Schmid, INRIA Grenoble Rhone-Alpes, Montbonnot, France
pp. 2782-2795
SHORT PAPERS
M. G. Baydogan, Security & Defense Syst. Initiative, Tempe, AZ, USA
G. Runger, Sch. of Comput., Inf. & Decision Syst. Eng., Arizona State Univ., Tempe, AZ, USA
E. Tuv, Logic Technol. Dev., Intel, Chandler, AZ, USA
pp. 2796-2802
Minyoung Kim, Dept. of Electron. & IT Media Eng., Seoul Nat. Univ. of Sci. & Technol., Seoul, South Korea
pp. 2803-2809
N. Murray, Xerox Res. Centre Eur., Meylan, France
M. Vanrell, Centre de Visio per Computador, Barcelona, Spain
X. Otazu, Centre de Visio per Computador, Barcelona, Spain
C. A. Parraga, Centre de Visio per Computador, Barcelona, Spain
pp. 2810-2816
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