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IEEE Transactions on Pattern Analysis and Machine Intelligence
Oct. 2013 (vol. 35 no. 10)
ISSN: 0162-8828
Table of Contents
Front Covers
REGULAR PAPERS
Eryun Liu, Dept. of Comput. Sci. & Eng., Michigan State Univ. (MSU), East Lansing, MI, USA
A. K. Jain, Dept. of Comput. Sci. & Eng., Michigan State Univ., East Lansing, MI, USA
Jie Tian, Sch. of Life Sci. & Technol., Xidian Univ., Xi'an, China
pp. 2307-2322
Tingting Mu, Dept. of Electr. Eng. & Electron., Univ. of Liverpool, Liverpool, UK
J. Y. Goulermas, Dept. of Electr. Eng. & Electron., Univ. of Liverpool, Liverpool, UK
pp. 2340-2356
A. Censi, Control & Dynamical Syst. Dept., California Inst. of Technol., Pasadena, CA, USA
D. Scaramuzza, Dept. of Inf., Univ. of Zurich, Zurich, Switzerland
pp. 2357-2370
G. D. Evangelidis, Perception Team, INRIA Rhone-Alpes, Grenoble, France
C. Bauckhage, Fraunhofer IAIS, St. Augustin, Germany
pp. 2371-2386
A. Penate-Sanchez, Inst. de Roboticai Inf. Ind., UPC, Barcelona, Spain
J. Andrade-Cetto, Inst. de Roboticai Inf. Ind., UPC, Barcelona, Spain
F. Moreno-Noguer, Inst. de Roboticai Inf. Ind., UPC, Barcelona, Spain
pp. 2387-2400
Xin Geng, Sch. of Comput. Sci. & Eng., Southeast Univ., Nanjing, China
Chao Yin, Sch. of Comput. Sci. & Eng., Southeast Univ., Nanjing, China
Zhi-Hua Zhou, Nat. Key Lab. for Novel Software Technol., Nanjing Univ., Nanjing, China
pp. 2401-2412
Xiang-Dong Zhou, Beijing Key Lab. of Human-Comput. Interaction, Inst. of Software, Beijing, China
Da-Han Wang, Nat. Lab. of Pattern Recognition (NLPR), Inst. of Autom., Beijing, China
Feng Tian, State Key Lab. of Comput. Sci., Inst. of Software, Beijing, China
Cheng-Lin Liu, Nat. Lab. of Pattern Recognition (NLPR), Inst. of Autom., Beijing, China
M. Nakagawa, Dept. of Comput. & Inf. Sci., Tokyo Univ. of Agric. & Technol., Koganei, Japan
pp. 2413-2426
Junseok Kwon, Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
Kyoung Mu Lee, Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
pp. 2427-2441
Gang Wang, Adv. Digital Sci. Center, Nanyang Technol. Univ., Singapore, Singapore
D. Forsyth, Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
D. Hoiem, Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
pp. 2442-2453
Yongmian Zhang, IT Res. Div., Konica Minolta Lab. U.S.A. Inc., San Mateo, CA, USA
Yifan Zhang, Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
E. Swears, Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
N. Larios, Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Ziheng Wang, Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Qiang Ji, Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
pp. 2468-2483
Seyed Mohammad Hassan Anvar, Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Wei-Yun Yau, Inst. for Infocomm Res., A*STAR, Singapore, Singapore
Eam Khwang Teoh, Div. of Control & Instrum., Nanyang Technol. Univ., Singapore, Singapore
pp. 2484-2497
Yu-Wing Tai, Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Xiaogang Chen, Inst. of Image Process. & Pattern Recognition, Shanghai Jiaotong Univ., Shanghai, China
Sunyeong Kim, Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Seon Joo Kim, Dept. of Comput. Sci., Yonsei Univ., Seoul, South Korea
Feng Li, Mitsubishi Electr. Res. Labs., Cambridge, MA, USA
Jie Yang, Inst. of Image Process. & Pattern Recognition, Shanghai Jiaotong Univ., Shanghai, China
Jingyi Yu, Dept. of CIS, Univ. of Delaware, Newark, DE, USA
Y. Matsushita, Microsoft Res. Asia, Beijing, China
M. S. Brown, Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
pp. 2498-2512
T. Dekel Basha, Dept. of Electr. Eng., Tel-Aviv Univ., Tel-Aviv, Israel
Y. Moses, Interdiscipl. Center, Herzliya, Israel
S. Avidan, Dept. of Electr. Eng., Tel-Aviv Univ., Tel-Aviv, Israel
pp. 2513-2525
N. Jacobs, Dept. of Comput. Sci., Univ. of Kentucky, Lexington, KY, USA
A. Abrams, Dept. of Comput. Sci., Univ. of Kentucky, Lexington, KY, USA
R. Pless, Dept. of Comput. Sci., Washington Univ. in St. Louis, St. Louis, MO, USA
pp. 2526-2538
SHORT PAPERS
Dongbo Min, Adv. Digital Sci. Center, Singapore, Singapore
Jiangbo Lu, Adv. Digital Sci. Center, Singapore, Singapore
M. N. Do, 115 Coordinated Sci. Lab., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
pp. 2539-2545
Zhou Ren, Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Junsong Yuan, Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Wenyu Liu, Huazhong Univ. of Sci. & Technol., Wuhan, China
pp. 2546-2552
I. Leichter, Adv. Technol. Labs. Israel- Microsoft Res., Microsoft R&D Center, Haifa, Israel
E. Krupka, Adv. Technol. Labs. Israel- Microsoft Res., Microsoft R&D Center, Haifa, Israel
pp. 2553-2560
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