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IEEE Transactions on Pattern Analysis and Machine Intelligence
Dec. 2012 (vol. 34 no. 12)
ISSN: 0162-8828
Table of Contents
 | REGULAR PAPERS |
Hai Ting Lin, Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
Zheng Lu, Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
S. Lin, Microsoft Res. Asia, Beijing, China
M. S. Brown, Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
pp. 2289-2302
R. Hartley, Sch. of Eng. (RSISE), Australian Nat. Univ., Canberra, ACT, Australia
Hongdong Li, Sch. of Eng. (RSISE), Australian Nat. Univ., Canberra, ACT, Australia
pp. 2303-2314
G. Romano, Fondazione Ugo Bordoni, Rome, Italy
pp. 2315-2326
M. Cohen, Comput. Sci. Dept., Technion - Israel Inst. of Technol., Haifa, Israel
I. Shimshoni, Dept. of Inf. Syst., Univ. of Haifa, Haifa, Israel
E. Rivlin, Comput. Sci. Dept., Technion - Israel Inst. of Technol., Haifa, Israel
pp. 2327-2340
Jingu Heo, Samsung Adv. Inst. of Technol., Yongin, South Korea
M. Savvides, Cylab Biometrics Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 2341-2350
S. Mittal, Dept. of Stat., Columbia Univ., New York, NY, USA
S. Anand, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
P. Meer, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
pp. 2351-2364
Ning Chen, Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Jun Zhu, Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Fuchun Sun, Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
E. P. Xing, Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 2365-2378
B. Kerautret, LORIA, Univ. of Lorraine, Vandoeuvre-les-Nancy, France
J-O Lachaud, Lab. de Math. (LAMA), Univ. of Savoie, Le-Bourget-du-Lac, France
pp. 2379-2392
Jun Wang, Bus. Analytics & Math. Sci. Dept., IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
S. Kumar, Google Res., New York, NY, USA
Shih-Fu Chang, Dept. of Electr. & Comput. Eng., Columbia Univ., New York, NY, USA
pp. 2393-2406
Meizhu Liu, Dept. of CISE, Univ. of Florida, Gainesville, FL, USA
B. C. Vemuri, Dept. of CISE, Univ. of Florida, Gainesville, FL, USA
pp. 2407-2419
Weiming Hu, Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
Xi Li, Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
Wenhan Luo, Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
Xiaoqin Zhang, Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
S. Maybank, Dept. of Comput. Sci. & Inf. Syst., Birkbeck Coll., London, UK
Zhongfei Zhang, Dept. of Comput. Sci., Binghamton Univ., Binghamton, NY, USA
pp. 2420-2440
A. Patron-Perez, Dept. of Comput. Sci., George Washington Univ., Washington, DC, USA
I. Reid, Dept. of Eng. Sci., Univ. of Oxford, Oxford, UK
A. Zisserman, Dept. of Eng. Sci., Univ. of Oxford, Oxford, UK
pp. 2441-2453
S. Zafeiriou, Dept. of Comput., Imperial Coll. London, London, UK
M. Pantic, Dept. of Comput., Imperial Coll. London, London, UK
pp. 2454-2466
H. S. Baird, Dept. of Comput. Sci. & Eng., Lehigh Univ., Bethlehem, PA, USA
pp. 2467-2480
 | SHORT PAPERS |
Mani Malek Esmaeili, Electr. & Comput. Eng. Dept., Univ. of British Columbia, Vancouver, BC, Canada
R. K. Ward, Electr. & Comput. Eng. Dept., Univ. of British Columbia, Vancouver, BC, Canada
M. Fatourechi, Electr. & Comput. Eng. Dept., Univ. of British Columbia, Vancouver, BC, Canada
pp. 2481-2488
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