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IEEE Transactions on Pattern Analysis and Machine Intelligence
Nov. 2012 (vol. 34 no. 11)
ISSN: 0162-8828
Table of Contents
EDITORIAL
REGULAR PAPERS
Jinli Suo, Dept. of Autom., Tsinghua Univ., Beijing, China
Xilin Chen, Key Lab. of Intell. Inf. Process., Inst. of Comput. Technol., Beijing, China
Shiguang Shan, Key Lab. of Intell. Inf. Process., Inst. of Comput. Technol., Beijing, China
Wen Gao, Key Lab. of Machine Perception, Peking Univ., Beijing, China
Qionghai Dai, Dept. of Autom., Tsinghua Univ., Beijing, China
pp. 2083-2096
F. Vasconcelos, Dept. of Electr. & Comput. Eng., Univ. of Coimbra, Coimbra, Portugal
J. P. Barreto, Dept. of Electr. & Comput. Eng., Univ. of Coimbra, Coimbra, Portugal
U. Nunes, Dept. of Electr. & Comput. Eng., Univ. of Coimbra, Coimbra, Portugal
pp. 2097-2107
José A. Rodríguez-Serrano, Textual & Visual Pattern Anal. Group, Xerox Res. Centre Eur., Meylan, France
F. Perronnin, Textual & Visual Pattern Anal. Group, Xerox Res. Centre Eur., Meylan, France
pp. 2108-2120
Xiaoyan Hu, Dept. of Comput. Sci., Stevens Inst. of Technol., Hoboken, NJ, USA
P. Mordohai, Dept. of Comput. Sci., Stevens Inst. of Technol., Hoboken, NJ, USA
pp. 2121-2133
G. K. L. Tam, Dept. of Comput. Sci. & Inf., Cardiff Univ., Cardiff, UK
R. W. H. Lau, Dept. of Comput. Sci., City Univ. of Hong Kong, Kowloon, China
pp. 2134-2146
J. M. Hughes, Dept. of Comput. Sci., Dartmouth Coll., Hanover, NH, USA
Dong Mao, Dept. of Math., Michigan State Univ., East Lansing, MI, USA
D. N. Rockmore, Dept. of Math., Dartmouth Coll., Hanover, NH, USA
Yang Wang, Dept. of Math., Michigan State Univ., East Lansing, MI, USA
Qiang Wu, Dept. of Math. Sci., Middle Tennessee Univ., Murfreesboro, TN, USA
pp. 2147-2157
P. Koehl, Dept. of Comput. Sci., Univ. of California, Davis, CA, USA
pp. 2158-2163
Chen Wang, Shanghai Key Lab. of Intell. Inf. Process., Fudan Univ., Shanghai, China
Junping Zhang, Shanghai Key Lab. of Intell. Inf. Process., Fudan Univ., Shanghai, China
Liang Wang, Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
Jian Pu, Shanghai Key Lab. of Intell. Inf. Process., Fudan Univ., Shanghai, China
Xiaoru Yuan, Key Lab. of Machine Perception, Peking Univ., Beijing, China
pp. 2164-2176
Gang Wang, Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
D. Hoiem, Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
D. Forsyth, Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
pp. 2177-2188
B. Alexe, Comput. Vision Lab., ETH Zurich, Zurich, Switzerland
T. Deselaers, Google Switzerland, Zurich, Switzerland
V. Ferrari, IPAB Inst., Univ. of Edinburgh, Edinburgh, UK
pp. 2189-2202
Y. Sahillioglu, Dept. of Comput. Eng., Koc Univ., Istanbul, Turkey
Y. Yemez, Dept. of Comput. Eng., Koc Univ., Istanbul, Turkey
pp. 2203-2215
Tingting Mu, University of Manchester, Manchester
John Yannis Goulermas, University of Liverpool, Liverpool
Jun'ichi Tsujii, Microsoft Research Asia, China
Sophia Ananiadou, University of Manchester, Manchester
pp. 2216-2232
Yigang Peng, Dept. of Autom., Tsinghua Univ., Beijing, China
A. Ganesh, Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
J. Wright, Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
Wenli Xu, Dept. of Autom., Tsinghua Univ., Beijing, China
Yi Ma, Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
pp. 2233-2246
Mohamed-Bécha Kaâniche, Higher Sch. of Commun. of Tunis (Sup'Com), Univ. of Carthage, El Ghazala, Tunisia
François Brémond, INRIA, Sophia Antipolis, France
pp. 2247-2258
A. J. Joshi, Google, Inc., Mountain View, CA, USA
F. Porikli, Mitsubishi Electr. Res. Labs., Cambridge, MA, USA
N. P. Papanikolopoulos, Dept. of Comput. Sci. & Eng., Univ. of Minnesota, Twin Cities, Minneapolis, MN, USA
pp. 2259-2273
SHORT PAPERS
R. Achanta, Images & Visual Representation Group, Ecole Polytech. Fed. de Lausanne, Lausanne, Switzerland
A. Shaji, Images & Visual Representation Group, Ecole Polytech. Fed. de Lausanne, Lausanne, Switzerland
K. Smith, Zurich Light Microscopy Center, ETH Zurich, Zurich, Switzerland
A. Lucchi, Comput. Vision Lab., Polytech. Fed. de Lausanne, Lausanne, Switzerland
P. Fua, Comput. Vision Lab., Polytech. Fed. de Lausanne, Lausanne, Switzerland
Sabine Süsstrunk, Images & Visual Representation Group, Ecole Polytech. Fed. de Lausanne, Lausanne, Switzerland
pp. 2274-2282
M. Eichner, Comput. Vision Lab., ETH Zurich, Zurich, Switzerland
V. Ferrari, IPAB Inst., Univ. of Edinburgh, Edinburgh, UK
pp. 2282-2288
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