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IEEE Transactions on Pattern Analysis and Machine Intelligence
Aug. 2012 (vol. 34 no. 8)
ISSN: 0162-8828
Table of Contents
REGULAR PAPERS
Weilong Yang, Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Yang Wang, Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC, Canada
Tian Lan, Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC, Canada
S. N. Robinovitch, Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
G. Mori, Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC, Canada
pp. 1549-1562
M. Pesaresi, Inst. for the Protection & Security of theCitizen, Joint Res. Center of the Eur. Comm., Ispra, Italy
G. K. Ouzounis, Inst. for the Protection & Security of theCitizen, Joint Res. Center of the Eur. Comm., Ispra, Italy
P. Soille, Inst. for the Protection & Security of theCitizen, Joint Res. Center of the Eur. Comm., Ispra, Italy
pp. 1533-1548
Jiaya Jia, Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Shatin, China
Sai-Kit Yeung, Pillar of Inf. Syst. Technol. & Design, Singapore Univ. of Technol. & Design, Singapore, Singapore
Tai-Pang Wu, Enterprise & Consumer Electron., Hong Kong Appl. Sci. & Technol. Res. Inst., Shatin, China
Chi-Keung Tang, Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
G. Medioni, Univ. of Southern California, Los Angeles, CA, USA
pp. 1482-1495
Fei Yin, Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
Qiu-Feng Wang, Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
Cheng-Lin Liu, Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
pp. 1469-1481
L. Agapito, Sch. of Electron. Eng. & Comput. Sci. (EECS), Queen Mary Univ. of London, London, UK
J. Xavier, Inst. for Syst. & Robot. (ISR), Tech. Univ. of Lisbon, Lisbon, Portugal
A. Del Bue, Dept. of the Ist. Italiano di Tecnol., PAVIS, Genova, Italy
M. Paladini, Sch. of Electron. Eng. & Comput. Sci. (EECS), Queen Mary Univ. of London, London, UK
pp. 1496-1508
H. Meinzer, Div. of Med. & Biol. Inf., German Cancer Res. Center (DKFZ), Heidelberg, Germany
M. Fangerau, Div. of Med. & Biol. Inf., German Cancer Res. Center (DKFZ), Heidelberg, Germany
M. Schmidt, Digital Image Process. Group, Univ. of Heidelberg, Heidelberg, Germany
T. R. dos Santos, Div. of Med. & Biol. Inf., German Cancer Res. Center (DKFZ), Heidelberg, Germany
A. M. Franz, Div. of Med. & Biol. Inf., German Cancer Res. Center (DKFZ), Heidelberg, Germany
L. Maier-Hein, Div. of Med. & Biol. Inf., German Cancer Res. Center (DKFZ), Heidelberg, Germany
J. M. Fitzpatrick, Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
pp. 1520-1532
R. K. Ward, Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
T. Guha, Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
pp. 1576-1588
T. Tung, Dept. of Intell. Sci. & Technol., Kyoto Univ., Kyoto, Japan
T. Matsuyama, Dept. of Intell. Sci. & Technol., Kyoto Univ., Kyoto, Japan
pp. 1645-1657
O. Ronneberger, Dept. of Comput. Sci., Univ. of Freiburg, Freiburg, Germany
T. Brox, Dept. of Comput. Sci., Univ. of Freiburg, Freiburg, Germany
T. Schmidt, Dept. of Comput. Sci., Univ. of Freiburg, Freiburg, Germany
M. Reisert, Dept. of Radiol., Med. Phys., Univ. Med. Center Freiburg, Freiburg, Germany
H. Skibbe, Dept. of Radiol., Med. Phys., Univ. Med. Center Freiburg, Freiburg, Germany
H. Burkhardt, Dept. of Comput. Sci., Univ. of Freiburg, Freiburg, Germany
pp. 1563-1575
Jianjiang Feng, Dept. of Autom., Tsinghua Univ., Beijing, China
Jifeng Dai, Dept. of Autom., Tsinghua Univ., Beijing, China
Jie Zhou, Dept. of Autom., Tsinghua Univ., Beijing, China
pp. 1618-1632
A. Prati, Dept. of Eng. Sci. & Methods, Univ. of Modena & Reggio Emilia, Reggio Emilia, Italy
G. Gualdi, Dept. of Inf. Eng., Univ. of Modena & Reggio Emilia, Modena, Italy
R. Cucchiara, Dept. of Inf. Eng., Univ. of Modena & Reggio Emilia, Modena, Italy
pp. 1589-1604
K. Hirakawa, Intell. Signal Syst. Lab., Univ. of Dayton, Dayton, OH, USA
A. Chakrabarti, Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA, USA
T. Zickler, Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA, USA
pp. 1509-1519
Xiaohui Shen, Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL, USA
Jialue Fan, Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL, USA
Ying Wu, Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL, USA
pp. 1633-1644
P. S. Mukherjee, Sch. of Stat., Univ. of Minnesota, Minneapolis, MN, USA
Peihua Qiu, Sch. of Stat., Univ. of Minnesota, Minneapolis, MN, USA
pp. 1457-1468
SHORT PAPERS
Fengchun Huang, Dept. ofMachine Intell., Peking Univ., Beijing, China
Yuru Pei, Dept. ofMachine Intell., Peking Univ., Beijing, China
Fuhao Shi, Dept. ofMachine Intell., Peking Univ., Beijing, China
Hongbin Zha, Dept. ofMachine Intell., Peking Univ., Beijing, China
pp. 1658-1664
D. Steedly, Microsoft Corp., Redmond, WA, USA
D. Nister, Microsoft Corp., Redmond, WA, USA
Yekeun Jeong, Microsoft Corp., Redmond, WA, USA
R. Szeliski, Microsoft Corp., Redmond, WA, USA
In-So Kweon, Dept. of Electr. Eng., KAIST, Daejeon, South Korea
pp. 1605-1617
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