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| H. Meinzer, M. Fangerau, M. Schmidt, J. M. Fitzpatrick, T. R. dos Santos, A. M. Franz, L. Maier-Hein, "Convergent Iterative Closest-Point Algorithm to Accomodate Anisotropic and Inhomogenous Localization Error," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 34, no. 8, pp. 1520-1532, Aug., 2012. | |||
| BibTex | x | ||
| @article{ 10.1109/TPAMI.2011.248, author = {H. Meinzer and M. Fangerau and M. Schmidt and J. M. Fitzpatrick and T. R. dos Santos and A. M. Franz and L. Maier-Hein}, title = {Convergent Iterative Closest-Point Algorithm to Accomodate Anisotropic and Inhomogenous Localization Error}, journal ={IEEE Transactions on Pattern Analysis and Machine Intelligence}, volume = {34}, number = {8}, issn = {0162-8828}, year = {2012}, pages = {1520-1532}, doi = {http://doi.ieeecomputersociety.org/10.1109/TPAMI.2011.248}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Pattern Analysis and Machine Intelligence TI - Convergent Iterative Closest-Point Algorithm to Accomodate Anisotropic and Inhomogenous Localization Error IS - 8 SN - 0162-8828 SP1520 EP1532 EPD - 1520-1532 A1 - H. Meinzer, A1 - M. Fangerau, A1 - M. Schmidt, A1 - J. M. Fitzpatrick, A1 - T. R. dos Santos, A1 - A. M. Franz, A1 - L. Maier-Hein, PY - 2012 KW - solid modelling KW - computational geometry KW - convergence of numerical methods KW - covariance matrices KW - image registration KW - iterative methods KW - medical image processing KW - mesh generation KW - point-based surface registration KW - convergent iterative closest-point algorithm KW - ICP algorithm KW - anisotropic localization error KW - inhomogenous localization error KW - geometric alignment KW - 3D models KW - point correspondences KW - data alignment KW - isotropic Gaussian noise KW - partial overlapping surfaces KW - covariance matrices KW - surface meshes KW - mesh extraction KW - medical imaging data KW - partial surface registration KW - Iterative closest point algorithm KW - Measurement KW - Covariance matrix KW - Cameras KW - Three dimensional displays KW - Noise KW - Algorithm design and analysis KW - anisotropic weighting. KW - Registration KW - surface algorithms KW - ICP KW - point-based registration VL - 34 JA - IEEE Transactions on Pattern Analysis and Machine Intelligence ER - | |||
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