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| Seungkyu Lee, Yanxi Liu, "Curved Glide-Reflection Symmetry Detection," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 34, no. 2, pp. 266-278, February, 2012. | |||
| BibTex | x | ||
| @article{ 10.1109/TPAMI.2011.118, author = { Seungkyu Lee and Yanxi Liu}, title = {Curved Glide-Reflection Symmetry Detection}, journal ={IEEE Transactions on Pattern Analysis and Machine Intelligence}, volume = {34}, number = {2}, issn = {0162-8828}, year = {2012}, pages = {266-278}, doi = {http://doi.ieeecomputersociety.org/10.1109/TPAMI.2011.118}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Pattern Analysis and Machine Intelligence TI - Curved Glide-Reflection Symmetry Detection IS - 2 SN - 0162-8828 SP266 EP278 EPD - 266-278 A1 - Seungkyu Lee, A1 - Yanxi Liu, PY - 2012 KW - image segmentation KW - computer vision KW - feature extraction KW - saliency detection KW - curved glide reflection symmetry detection KW - bilateral reflection symmetry KW - 2D euclidean space KW - feature based approach KW - unsegmented 2D images KW - axis parameter space KW - APS KW - computer vision KW - biomedical imaging KW - Three dimensional displays KW - Detection algorithms KW - Feature extraction KW - Computer vision KW - Image edge detection KW - Algorithm design and analysis KW - curved surface. KW - Symmetry KW - glide reflection KW - curved axis VL - 34 JA - IEEE Transactions on Pattern Analysis and Machine Intelligence ER - | |||
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