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Recognizing Planar Symbols with Severe Perspective Deformation
April 2010 (vol. 32 no. 4)
pp. 755-762
ASCII Text
x 
 
Linlin Li, Chew Lim Tan, "Recognizing Planar Symbols with Severe Perspective Deformation," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 32, no. 4, pp. 755-762, April, 2010.
 
 
BibTex
x
 
@article{ 10.1109/TPAMI.2009.196,
author = {Linlin Li and Chew Lim Tan},
title = {Recognizing Planar Symbols with Severe Perspective Deformation},
journal ={IEEE Transactions on Pattern Analysis and Machine Intelligence},
volume = {32},
number = {4},
issn = {0162-8828},
year = {2010},
pages = {755-762},
doi = {http://doi.ieeecomputersociety.org/10.1109/TPAMI.2009.196},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - JOUR
JO - IEEE Transactions on Pattern Analysis and Machine Intelligence
TI - Recognizing Planar Symbols with Severe Perspective Deformation
IS - 4
SN - 0162-8828
SP755
EP762
EPD - 755-762
A1 - Linlin Li,
A1 - Chew Lim Tan,
PY - 2010
KW - Symbol recognition
KW - perspective deformation.
VL - 32
JA - IEEE Transactions on Pattern Analysis and Machine Intelligence
ER -
 
Linlin Li, National University of Singapore, Singapore
Chew Lim Tan, National University of Singapore, Singapore
A common problem encountered in recognizing real-scene symbols is the perspective deformation. In this paper, a recognition method resistant to perspective deformation is proposed, based on Cross-Ratio Spectrum descriptor. This method shows good resistance to severe perspective deformation and good discriminating power to similar symbols.

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Index Terms:
Symbol recognition, perspective deformation.
Citation:
Linlin Li, Chew Lim Tan, "Recognizing Planar Symbols with Severe Perspective Deformation," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 32, no. 4, pp. 755-762, April 2010, doi:10.1109/TPAMI.2009.196
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