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| Chauã C. Queirolo, Luciano Silva, Olga R.P. Bellon, Maurício Pamplona Segundo, "3D Face Recognition Using Simulated Annealing and the Surface Interpenetration Measure," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 32, no. 2, pp. 206-219, February, 2010. | |||
| BibTex | x | ||
| @article{ 10.1109/TPAMI.2009.14, author = {Chauã C. Queirolo and Luciano Silva and Olga R.P. Bellon and Maurício Pamplona Segundo}, title = {3D Face Recognition Using Simulated Annealing and the Surface Interpenetration Measure}, journal ={IEEE Transactions on Pattern Analysis and Machine Intelligence}, volume = {32}, number = {2}, issn = {0162-8828}, year = {2010}, pages = {206-219}, doi = {http://doi.ieeecomputersociety.org/10.1109/TPAMI.2009.14}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Pattern Analysis and Machine Intelligence TI - 3D Face Recognition Using Simulated Annealing and the Surface Interpenetration Measure IS - 2 SN - 0162-8828 SP206 EP219 EPD - 206-219 A1 - Chauã C. Queirolo, A1 - Luciano Silva, A1 - Olga R.P. Bellon, A1 - Maurício Pamplona Segundo, PY - 2010 KW - 3D face recognition KW - Surface Interpenetration Measure (SIM) KW - range image registration. VL - 32 JA - IEEE Transactions on Pattern Analysis and Machine Intelligence ER - | |||
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