CSDL Home IEEE Transactions on Pattern Analysis & Machine Intelligence 2010 vol.32 Issue No.01 - January
Issue No.01 - January (2010 vol.32)
Vincent Gay-Bellile , CEA Saclay and LASMEA, UMR, CNRS/UBP, France
Adrien Bartoli , LASMEA, UMR, CNRS/UBP, France
Patrick Sayd , CEA Saclay, France
The registration problem for images of a deforming surface has been well studied. External occlusions are usually well handled. In 2D image-based registration, self-occlusions are more challenging. Consequently, the surface is usually assumed to be only slightly self-occluding. This paper is about image-based nonrigid registration with self-occlusion reasoning. A specific framework explicitly modeling self-occlusions is proposed. It is combined with an intensity-based, “direct” data term for registration. Self-occlusions are detected as shrinkage areas in the 2D warp. Experimental results on several challenging data sets show that our approach successfully registers images with self-occlusions while effectively detecting the self-occluded regions.
Nonrigid registration, self-occlusion, direct method, image retexturing.
Vincent Gay-Bellile, Adrien Bartoli, Patrick Sayd, "Direct Estimation of Nonrigid Registrations with Image-Based Self-Occlusion Reasoning", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.32, no. 1, pp. 87-104, January 2010, doi:10.1109/TPAMI.2008.265