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IEEE Transactions on Pattern Analysis and Machine Intelligence
December 2008 (vol. 30 no. 12)
ISSN: 0162-8828
Table of Contents
Editorial
Regular Papers
Qingping Tao, GC Image, LLC, Lincoln
Stephen D. Scott, University of Nebraska, Lincoln
N. V. Vinodchandran, University of Nebraska, Lincoln
Thomas Takeo Osugi, Sphere Communications, Lincolnshire
Brandon Mueller, Gallup, Inc., Omaha
pp. 2084-2098
Qiyao Yu, Eutrovision Inc., Shanghai
David A. Clausi, University of Waterloo, Waterloo
pp. 2126-2139
Yi-Chin Fang, National Kaohsiung First University of Science, Institute of Engineering Science and Technology, Kaohsiung City
Bo-Wen Wu, National Kaohsiung First University of Science, Institute of Engineering Science and Technology, Kaohsiung City
pp. 2218-2228
Short Papers
Yun Fu, University of Illinois at Urbana-Champaign, Urbana
Shuicheng Yan, National University of Singapore, Singapore
Thomas S. Huang, University of Illinois at Urbana-Champaign, Urbana
pp. 2229-2235
Jaemo Sung, POSTECH, Pohang
Zoubin Ghahramani, University of Cambridge, Cambridge
Sung-Yang Bang, POSTECH, Pohang
pp. 2236-2242
Kwan-Yee K. Wong, The University of Hong Kong, Hong Kong
Guoqiang Zhang, The University of Hong Kong, Hong Kong
Chen Liang, The University of Hong Kong, Hong Kong
Hui Zhang, United International College, Tangjiawan, Zhuhai, Guangdong
pp. 2243-2248
Annual Index
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