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IEEE Transactions on Pattern Analysis and Machine Intelligence
July 2006 (vol. 28 no. 7)
ISSN: 0162-8828
Table of Contents
PAPERS
Hong Chen, Dept. of Stat. & Comput. Sci., California Univ., Los Angeles, CA
Song-Chun Zhu, Dept. of Stat. & Comput. Sci., California Univ., Los Angeles, CA
pp. 1025-1040
A. Biem, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY
pp. 1041-1051
G. Mori, Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC
pp. 1052-1062
R. Beare, Dept. of Medicine, Monash Univ., Clayton, Vic.
pp. 1063-1074
R. Paredes, Dept. de Sistemas Informaticos y Computacion, Univ. Politecnica de Valencia
E. Vidal, Dept. de Sistemas Informaticos y Computacion, Univ. Politecnica de Valencia
pp. 1100-1110
B. Matei, Vision Technol. Lab., Sarnoff Corp., Princeton, NJ
Ying Shan, Vision Technol. Lab., Sarnoff Corp., Princeton, NJ
H.S. Sawhney, Vision Technol. Lab., Sarnoff Corp., Princeton, NJ
Yi Tan, Vision Technol. Lab., Sarnoff Corp., Princeton, NJ
R. Kumar, Vision Technol. Lab., Sarnoff Corp., Princeton, NJ
pp. 1111-1126
B. Micusik, Inst. of Comput. Aided Autom., Vienna Univ. of Technol.
pp. 1135-1149
SHORT PAPERS
Y. Yacoob, Comput. Vision Lab., Maryland Univ., College Park, MD
L.S. Davis, Comput. Vision Lab., Maryland Univ., College Park, MD
pp. 1164-1169
A. Makadia, Dept. of Comput. & Inf. Sci., Pennsylvania Univ., Philadelphia, PA
K. Daniilidis, Dept. of Comput. & Inf. Sci., Pennsylvania Univ., Philadelphia, PA
pp. 1170-1175
I. Miyagawa, Image Process. Group, Nippon Telegraph & Telephone Corp., Kanagawa
K. Arakawa, Image Process. Group, Nippon Telegraph & Telephone Corp., Kanagawa
pp. 1176-1181
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