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Issue No.02 - February (2003 vol.25)
pp: 162-173
<p><b>Abstract</b>—A method for locating distorted grid structures in images is presented. The method is based on the theories of template matching and Bayesian image restoration. The grid is modeled as a deformable template. Prior knowledge of the grid is described through a Markov Random Field (MRF) model which represents the spatial coordinates of the grid nodes. Knowledge of how grid nodes are depicted in the observed image is described through the observation model. The prior consists of a node prior and an arc (edge) prior, both modeled as Gaussian MRFs. The node prior models variations in the positions of grid nodes and the arc prior models variations in row and column spacing across the grid. Grid matching is done by placing an initial rough grid over the image and applying an ensemble annealing scheme to maximize the posterior distribution of the grid. The method can be applied to noisy images with missing grid nodes and grid-node artifacts and the method accommodates a wide range of grid distortions including: large-scale warping, varying row/column spacing, as well as nonrigid random fluctuations of the grid nodes. The methodology is demonstrated in two case studies concerning 1) localization of DNA signals in hybridization filters and 2) localization of knit units in textile samples.</p>
Deformable model, Markov random field, ensemble annealing, graph matching, high-throughput screening, textile analysis.
Karsten Hartelius, Jens Michael Carstensen, "Bayesian Grid Matching", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.25, no. 2, pp. 162-173, February 2003, doi:10.1109/TPAMI.2003.1177149
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