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IEEE Transactions on Pattern Analysis and Machine Intelligence
January 2003 (vol. 25 no. 1)
ISSN: 0162-8828
Table of Contents
PAPERS
Transformation-Invariant Clustering Using the EM Algorithm
(Abstract)
Brendan J. Frey
Nebojsa Jojic
pp. 1-17
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Contour Line and Geographic Feature Extraction from USGS Color Topographical Paper Maps
(Abstract)
Alireza Khotanzad
Edmund Zink
pp. 18-31
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Suboptimal Minimum Cluster Volume Cover-Based Method for Measuring Fractal Dimension
(Abstract)
Charles R. Tolle
Timothy R. McJunkin
David J. Gorisch
pp. 32-41
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A Class of Discrete Multiresolution Random Fields and Its Application to Image Segmentation
(Abstract)
Roland Wilson
Chang-Tsun Li
pp. 42-56
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Statistical Edge Detection: Learning and Evaluating Edge Cues
(Abstract)
Scott Konishi
Alan L. Yuille
James M. Coughlan
Song Chun Zhu
pp. 57-74
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Multilevel Classification of Milling Tool Wear with Confidence Estimation
(Abstract)
Randall K. Fish
Mari Ostendorf
Gary D. Bernard
David A. Castanon
pp. 75-85
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Representation and Self-Similarity of Shapes
(Abstract)
Davi Geiger
Tyng-Luh Liu
Robert V. Kohn
pp. 86-99
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When Is the Shape of a Scene Unique Given Its Light-Field: A Fundamental Theorem of 3D Vision?
(Abstract)
Simon Baker
Terence Sim
Takeo Kanade
pp. 100-109
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SHORT PAPERS
Sum Versus Vote Fusion in Multiple Classifier Systems
(Abstract)
J. Kittler
F.M. Alkoot
pp. 110-115
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On Aligning Curves
(Abstract)
Thomas B. Sebastian
Philip N. Klein
Benjamin B. Kimia
pp. 116-125
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Polling an Image for Circles by Random Lines
(Abstract)
Y.C. Cheng
Y.-S. Liu
pp. 125-130
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Adaptive Local Thresholding by Verification-Based Multithreshold Probing with Application to Vessel Detection in Retinal Images
(Abstract)
Xiaoyi Jiang
Daniel Mojon
pp. 131-137
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2002 Reviewers List
2002 Reviewers List
(HTML)
pp. 138-142
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Peer Review Notice
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