CSDL Home IEEE Transactions on Pattern Analysis & Machine Intelligence 2000 vol.22 Issue No.09 - September
Issue No.09 - September (2000 vol.22)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/34.877527
<p><b>Abstract</b>—A unique imaging modality based on Equal Thickness Contours (ETC) has introduced a new opportunity for 3D shape reconstruction from multiple views. These ETCs can be generated through an interference between transmitted and diffracted beams. We present a computational framework for representing each view of an object in terms of its <it>object thickness</it> and then integrating these representations into a <it>3D surface</it> by algebraic reconstruction. In this framework, the object thickness is first derived from ideal contours and then extended to real data. For real data, the object thickness is inferred by grouping curve segments that correspond to points of second derivative maxima. At each step of the process, we use some form of regularization to ensure closeness to the original features as well as neighborhood continuity. We apply our approach to images of a submicron crystal structure obtained through a holographic process.</p>
Shape-from-X, 3D construction, shape from multiple views.
Ge Cong, Bahram Parvin, "Shape Recovery from Equal Thickness Contours", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.22, no. 9, pp. 1055-1061, September 2000, doi:10.1109/34.877527