CSDL Home IEEE Transactions on Pattern Analysis & Machine Intelligence 2000 vol.22 Issue No.07 - July
Issue No.07 - July (2000 vol.22)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/34.865190
<p><b>Abstract</b>—In the literature, methods for fitting superellipses to data tend to be computationally expensive due to the nonlinear nature of the problem. This paper describes and tests several fitting techniques which provide different trade-offs between efficiency and accuracy. In addition, we describe various alternative error of fit (EOF) measures that can be applied by most superellipse fitting methods.</p>
Curve, superellipse, fitting, error measure.
Paul L. Rosin, "Fitting Superellipses", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.22, no. 7, pp. 726-732, July 2000, doi:10.1109/34.865190