CSDL Home IEEE Transactions on Pattern Analysis & Machine Intelligence 2000 vol.22 Issue No.01 - January
Issue No.01 - January (2000 vol.22)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/34.824819
<p><b>Abstract</b>—The primary goal of pattern recognition is supervised or unsupervised classification. Among the various frameworks in which pattern recognition has been traditionally formulated, the statistical approach has been most intensively studied and used in practice. More recently, neural network techniques and methods imported from statistical learning theory have been receiving increasing attention. The design of a recognition system requires careful attention to the following issues: definition of pattern classes, sensing environment, pattern representation, feature extraction and selection, cluster analysis, classifier design and learning, selection of training and test samples, and performance evaluation. In spite of almost 50 years of research and development in this field, the general problem of recognizing complex patterns with arbitrary orientation, location, and scale remains unsolved. New and emerging applications, such as data mining, web searching, retrieval of multimedia data, face recognition, and cursive handwriting recognition, require robust and efficient pattern recognition techniques. The objective of this review paper is to summarize and compare some of the well-known methods used in various stages of a pattern recognition system and identify research topics and applications which are at the forefront of this exciting and challenging field.</p>
Statistical pattern recognition, classification, clustering, feature extraction, feature selection, error estimation, classifier combination, neural networks.
Anil K. Jain, Robert P.W. Duin, Jianchang Mao, "Statistical Pattern Recognition: A Review", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.22, no. 1, pp. 4-37, January 2000, doi:10.1109/34.824819