CSDL Home IEEE Transactions on Pattern Analysis & Machine Intelligence 1999 vol.21 Issue No.07 - July
Issue No.07 - July (1999 vol.21)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/34.777377
<p><b>Abstract</b>—In this paper we describe a new technique for detecting and characterizing ellipsoidal shapes automatically from any type of image. This technique is a single pass algorithm which can extract any group of ellipse parameters or characteristics which can be computed from those parameters without having to detect all five parameters for each ellipsoidal shape. Moreover, the method can explicitly incorporate any a priori knowledge the user may have concerning ellipse parameters. The method is based on techniques from Projective Geometry and on the Hough Transform. This technique can significantly reduce interpretation and computation time by automatically extracting only those features or geometric parameters of interest from images and making exact use of a priori information.</p>
Hough Transform, ellipse detection, parameter estimation, projective geometry, feature extraction, computer vision.
Nick Bennett, Robert Burridge, Naoki Saito, "A Method to Detect and Characterize Ellipses Using the Hough Transform", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.21, no. 7, pp. 652-657, July 1999, doi:10.1109/34.777377