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Issue No.03 - March (1998 vol.20)
pp: 344-351
ABSTRACT
<p><b>Abstract</b>—The bitmap obtained by scanning a printed pattern depends on the exact location of the scanning grid relative to the pattern. We consider ideal sampling with a regular lattice of delta functions. The displacement of the lattice relative to the pattern is random and obeys a uniform probability density function defined over a unit cell of the lattice. Random-phase sampling affects the edge-pixels of sampled patterns. The resulting number of distinct bitmaps and their relative frequencies can be predicted from a mapping of the original pattern boundary to the unit cell (called a modulo-grid diagram). The theory is supported by both simulated and experimental results. The modulo-grid diagram may be useful in helping to understand the effects of edge-pixel variation on Optical Character Recognition.</p>
INDEX TERMS
Spatial sampling, random phase sampling, digitization, optical character recognition, document defect models, scanner models, modulo-grid diagram, locales.
CITATION
Prateek Sarkar, George Nagy, Jiangying Zhou, Daniel Lopresti, "Spatial Sampling of Printed Patterns", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.20, no. 3, pp. 344-351, March 1998, doi:10.1109/34.667892
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