CSDL Home IEEE Transactions on Pattern Analysis & Machine Intelligence 1998 vol.20 Issue No.02 - February
Seeing Behind the Scene: Analysis of Photometric Properties of Occluding Edges by the Reversed Projection Blurring Model
Issue No.02 - February (1998 vol.20)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/34.659933
<p><b>Abstract</b>—This paper analyzes photometric properties of occluding edges and proves that an object surface behind a nearer object is partially observable beyond the occluding edges. We first discuss a limitation of the image blurring model using the convolution, and then present an optical flux based blurring model named the <it>reversed projection blurring</it> (RPB) model. Unlike the multicomponent blurring model proposed by Nguyen et al., the RPB model enables us to explore the optical phenomena caused by a shift-variant point spread function that appears at a depth discontinuity. Using the RPB model, theoretical analysis of occluding edge properties are given and two characteristic phenomena are shown: (1) a blurred occluding edge produces the same brightness profiles as would be predicted for a surface edge on the occluding object when the occluded surface radiance is uniform and (2) a non-monotonic brightness transition would be observed in blurred occluding edge profiles when the occluded object has a surface edge. Experimental results using real images have demonstrated the validity of the RPB model as well as the observability of the characteristic phenomena of blurred occluding edges.</p>
Occluding edge, image blurring model, reversed projection, shift-variant point spread function, finite depth of field.
Hisanaga Fujiwara, Takashi Matsuyama, "Seeing Behind the Scene: Analysis of Photometric Properties of Occluding Edges by the Reversed Projection Blurring Model", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.20, no. 2, pp. 155-167, February 1998, doi:10.1109/34.659933